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GE LOGIQ E9 Service Manual page 288

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GE H
EALTHCARE
D
5180263-100, R
IRECTION
7-5-17-1
Digital Receive (cont'd)
Tests the signal path from the DRX to the GFI to the BEP. Also tests for latency signals of the DRX or
Nathan to the GFI.
Name: FDEMOD Signal Test
Description: Signal path test starting from the Fixed Demod on the GFI
Run Time: 00:03
If this test failed:
1.) Replace the PCIe cable.
2.) If GFI test above fails, replace the GFI board.
3.) Replace the BEP.
Name: DRX High Speed Bit Error
Description: High Speed Bit Error Test on the DRX
Run Time: 00:03
If this test failed:
1.) Swap DRX boards to determine if the failure point changes as the boards are moved.
2.) Replace any failed DRX boards.
3.) Interface to GFI may be cause of the failure. See:
Name: DRX IF FPGA Test
Description: Signal path test starting from IF FPGA on DRX boards
Run Time: 00:03
If this test failed:
1.) Swap DRX boards to determine if the failure point changes as the boards are moved.
2.) Replace any failed DRX boards.
3.) Interface to GFI may be cause of the failure. See:
Name: DRX ASIC Test
Description: Digital Signal path tests sourced from output of Nathan ASIC
Run Time: 00:03
1.) Swap DRX boards to determine if the failure point changes as the boards are moved.
2.) Replace any failed DRX boards.
3.) Interface to GFI may be cause of the failure. See:
7 - 44
5
EV
Section 7-5 - Common Service Desktop
LOGIQ E9 Service Manual
7-5-17-3 "GFI" on page
7-5-17-3 "GFI" on page
7-5-17-3 "GFI" on page
7-50.
7-50.
7-50.

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