13.7 Test Operation
You can change device values and turn on and off bit devices on the screen when the FX ladder monitor is executed. This
section describes how to display the test menu screen.
For the procedure for changing device values and turning on and off bit devices, see the following.
➠
3.3.8 Test operation for the monitor device ([Test])
13.7.1
Displaying the test menu screen
■1. Displaying the test menu screen
The procedure for displaying the test menu screen during FX ladder monitoring is described below.
Step 1.
Touch [Menu].
Step 2.
Touch [TEST].
Step 3.
The test menu screen is displayed.
Change device values by operating the window.
For further information about the operation procedure, see the following:
➠
3.3.8 Test operation for the monitor device ([Test])
Touch "MENU"
Word device values displayed
Test menu screen
POINT
POINT
POINT
The present and set values of word devices are hidden behind the test menu screen.
You can display hidden present and set values by scrolling them to the right or left using the [←]
or [→] key.
Touch "Test"
13.7 Test Operation
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