Quick Test Operation Of Monitor Devices - Mitsubishi Electric GT11 User Manual

14.2.8 Quick test operation of monitor devices

Before performing the quick test operations of the system monitor function (such as turning ON or
OFF bit device, changing the word device current value, changing the settings or current values of
the timer or counter, and changing the buffer memory current value), read through the manual
carefully and make yourself familiar with the operation method.
During quick test operation, never change the data of the devices which are used to perform
significant operation for the system.
False output or malfunction can cause an accident.
The quick test operation procedure for monitor devices is described below.
The Entry Monitor screen is taken as an example to describe quick test operation when the system monitor
function is executed.
The operation procedure is the same even if the batch monitor, TC monitor or BM monitor is selected.
(Example of quick test operation when the entry monitor is selected)
Quick test of bit devices
(1) To quick test of bit devices
WARNING
Touch "TEST"
Touch "OK"
Quick test of word devices
(2) To quick test of word devices
14.2.8 Quick test operation of monitor devices
This indicates that Quick
test operation is valid.
14.2 System Monitor
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