Test Operation - Mitsubishi Electric GOT2000 Series User Manual

5.7

Test Operation

In the device test mode of the sequence program monitor (SFC), device values can be changed on the screen.
For setting the device test mode, refer to the following.
➠
The test operation of devices is available by touching devices on the following screens in the device test mode.
Block information list on the block list screen
SFC diagram display area on the SFC diagram monitor screen
Device current value display area on the SFC diagram monitor screen
Ladder program display area in the zoom window
Touching a device displays the device test window.
• When touching bit devices
A bit device is switched between ON and OFF states in the device test window.
• When touching word devices
The GOT writes the value input in the device test window into the selected word device.
■1. How to operate device test window
(1) Bit devices
1) Device
Displays the selected device.
2) [ON] button
Turns on the bit device and writes the device state to the PLC CPU.
3) [OFF] button
Turns off the bit device and writes the device state to the PLC CPU.
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5.7 Test Operation
5.5.2 Key functions
5.6.2 Key functions
Screen applicable to device test mode
2)
1)
3)
Reference section
5.5.1 Displayed contents
5.6 How to Operate SFC
Diagram Monitor Screen
5.6.2 ■1. SFC diagram monitor
screen