Lit Related Events - Honeywell Vertex M User Manual

Figure 8-52. Configuration Editor New Page
Pressing the Record Known Good LITC button will cause a characterization to be performed on
all analyzers in the rack. Similarly, pressing the Line Integrity Test button will cause a line
integrity test to be performed immediately. This is in addition to the LITs which are scheduled
by the checkboxes in Figure 8-52.
During a LIT test or characterization, the HMI analyzer status display will change from MONT or
IDLE to LIT.

8.11.6 LIT Related Events

The Vertex M is capable of creating four Maintenance Faults 122 through 125 as shown in
"Maintenance Faults" on page 143.
If the LIT generates Event 124, care must be taken to inspect the integrity of the sample line
tubing along its length as the monitored sample may be taken from the break in the tubing, not
from the intended area.
The Vertex M is also capable of five new informational events as listed in "Information Events"
on page 152.
Note: If additional or replacement Vertex M Analyzers are purchased without specifying the LIT
option, no faults will be generated for the lack of the option in the new analyzer. However, an
INFO message will be logged in the Event History each time the LIT option is invoked. Existing
analyzers configured for LIT will be unaffected.
Vertex M 271 User Manual