Digital Receive Tests Table; Memory Tests Table - GE LOGIQ E9 Service Manual

D 5180483-100, R
IRECTION
7-5-9 Diagnostic Symptom Guide (cont'd)
Table 7-4
FDEMOD Signal Test
DRX High Speed Bit Error Test
DRX IF FPGA Test
DRX ASIC Test
DRX Signal Path Test
Nathan Channel Repeater
Nathan Alignment Test
Nathan Input TVG Alignment
Nathan MLA Data Alignment
Key:
T: The FRU is tested with the test.
R: The FRU is required for the test but is not specifically tested.
Table 7-5
GFI Memory Access Test
DRX IF FPGA Memory Test
DRX Memory Test
GTX IF FPGA Memory Test
GTX Memory Test
Key:
T: The FRU is tested with the test.
R: The FRU is required for the test but is not specifically tested.
PROPRIETARY TO GE
. 7
EV

Digital Receive Tests Table

Test
DRX (slot2)
T
T
T
T
T
T
T
T
T

Memory Tests Table

GTX GTX
Test
(slot2) (slot3)
T T
T T
Chapter 7 Diagnostics/Troubleshooting
LOGIQ E9 P
FRU
DRX (slot3) DRX (slot4)
T T
T T
T T
T T
T T
T T
T T
T T
T T
FRU
GTX DRX DRX DRX
(slot4) (slot2) (slot3) (slot4)
T T T
T T T
T
T
S
ROPRIETARY
GFI Back End Processor
T R
R R
R R
R R
R R
R R
R R
R R
R R
GFI Back End Processor
T R
R R
R R
R R
R R
M
ERVICE ANUAL
FREY Backplane
R
R
R
R
R
R
R
R
R
FREY Backplane
R
R
R
R
R
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