Test Functions; Test Function Control Registers - NEC mPD780208 Subseries User Manual

8-bit single-chip microcontrollers
Table of Contents

Advertisement

16.5 Test Functions

The internal test input flag (WTIF) is set to 1 and a standby release signal is generated when the watch timer
overflows.
Unlike the interrupt function, this function does not perform vector processing.
The basic configuration is shown in Figure 16-17.

16.5.1 Test function control registers

The test function is controlled by the following two registers.
• Interrupt request flag register 0H (IF0H)
• Interrupt mask flag register 0H (MK0H)
The names of the test input flag and test mask flag corresponding to the test input signal name are as follows.
Test Input Signal Name
INTWT
CHAPTER 16 INTERRUPT AND TEST FUNCTIONS
Figure 16-17. Basic Configuration of Test Function
Internal bus
Test input source
IF
(INTWT)
IF:
Test input flag
MK: Test mask flag
Test Input Flag
WTIF
User's Manual U11302EJ4V0UM
MK
Standby
release signal
Test Mask Flag
WTMK
357

Advertisement

Table of Contents
loading

This manual is also suitable for:

Mpd780204Mpd780206Mpd780208Mpd78p0208Mpd780204aMpd780205a ... Show all

Table of Contents