Executional Conditioned Device Test - Mitsubishi Electric MELSEC-Q00U(J)CPU User Manual

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3.11.4

Executional conditioned device test

This function changes a device value within the specified step of a
This enables debugging of the specified ladder block without modifying the program.
*1
The executional conditioned device test is not available for the SFC program.
(1) Operation of the executional conditioned device test
A device value will be changed based on the registration data once after the executional conditioned device test
setting is registered.
The changed device value becomes enabled in the ladder blocks of the specified step number and later.
Registration data
Program name
Step No.
Device
Setting value
: Before executing instruction
Execution timing
Programming tool
Note that a device value is changed within the specified step regardless of an execution status of the instruction in
the specified step.
<Program example>
Ladder mode
Executional conditioned device test which
sets "35" in D0 in this step is registered.
Note 3.5
Universal
Before executing the function with the Q02UCPU, Q03UDCPU, Q04UDHCPU, Q06UDHCPU, Q13UDHCPU, or
Q26UDHCPU, check the versions of the CPU module and programming tool used.
(
Page 465, Appendix 2)
Program: MAIN
: MAIN
: 10
: M0
: ON
List mode
Note 3.5
program.Note 3.5
*1
M0 is turned on.
<Operation>
Processing
LD M0
Changes the value in D0 to "35".
Value in D0
10
Value in M0
A device value is changed within the
specified step regardless of the value in M0.
CHAPTER 3 FUNCTIONS
+ K10 D0
35
45
OFF
159
3

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