Tdu Troubleshooting Tables And Status Leds - GE T2100 Service Manual

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Service manual (152 pages)

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Table of Contents

Troubleshooting

Item

When the T2100 Treadmill is manufactured, or whenever the event log (flash memory)

is erased, the system date and time (SDT) is set to January 1, 2050, 0:00:00 and is then

stored into the flash memory. When power is applied to the T2100 Treadmill, the SDT is

set to the saved SDT in the flash memory. While power is applied, the system updates

the SDT every second. When the power is lost, the updated SDT is saved back to the

flash memory. Therefore, the SDT is also the total power-up date and time, which is

always relative to the initial date and time of January 1, 2050, 0:00:00.

The SDT is used when logging events in two different modes, the Default Mode and

the Host Synchronized Mode.

Default Mode

When the T2100 Treadmill ON/OFF switch is turned to the ON position, the T2100

Treadmill will always initialize in the Default Mode. When an event is logged while

the system is in this mode, the event will be date and time stamped with the total

power-up date and time.

Host Synchronized Mode

When the T2100 Treadmill receives a valid date and time from a host device, such

as CASE v6 or the TDU, the T2100 Treadmill will enter the Host Synchronized Mode.

The T2100 Treadmill will stay in this mode until power is lost to the T2100 Treadmill.

While in this mode, the system keeps track of the number of seconds that pass since

the date and time were received from the host. When an event is logged while the

system is in this mode, the event will be date and time stamped with a date and time

relative to what was sent by the host.

NOTE:

When the T2100 Treadmill enters the Host Synchronized Mode, the Date and

Time Set event is stored with a date and time relative to the power-up date and

time. This event can be used to see how the following events with actual dates

and times chronologically fit in regards to the power-up date and time. In addition,

the date and time of the events can be used to match up with specific stress tests.