GE LOGIQ E9 Service Manual page 287

D 5180483-100, R
IRECTION
7-5-12-11 I/O Board Tests (cont'd)
Name: I/O Board Pwr Supply Test
Description: Compares all local I/O Board voltages to their specified values.
NOTE:
This is part of the self-monitoring process reported in the System Health Information section of
the Home page. See:
Run Time: 00:01
If this test failed:
1.) Replace the I/O Board.
Name: I/O Board GFI Voltage Test
Description: Compares all voltages on the GFI to their specified values. The GFI may not be working,
therefore the BEP cannot communicate with the Front End.
Run Time: 00:01
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Run the GFI tests to determine if the GFI is faulty. See:
Name: I/O Board GFI Temperature Test
Description: Reads temperature sensors on the GFI board and compares the values against specified
limits.
Run Time: 0:05
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Check the Front End card rack cooling fans.
3.) Run the GFI Tests to determine if the GFI is faulty. See:
Name: I/O Board Self Test
Description: The processor on the I/O Board performs a check of its basic functions.
Run Time: 00:01
If this test failed:
1.) Verify that the BEP to Backplane cable is properly connected and/or swap the cable with a known
good cable. If the problem continues:
2.) Replace the I/O Board.
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PROPRIETARY TO GE
. 7
EV
7-5-5 "Home" on page
Section 7-5 - Common Service Desktop
LOGIQ E9 P
7-26.
7-5-12-3 "GFI" on page
7-5-12-3 "GFI" on page
S M
ROPRIETARY ERVICE ANUAL
7-66.
7-66.