Setting Up Samples (Suss)For Instrument Corrections - Hitachi LAB-X5000 User Manual

Benchtop xrf analyzer
Table of Contents

Advertisement

6.4.2.2.
In a sample containing S and Cl, the Cl radiation will be emitted t 2.622keV. The
absorption edge for S is 2.47keV. The S in the sample will be excited by the Cl radiation
and the intensity of Cl radiation emanating from the sample will be reduced by the
presence of S.
6.4.2.3.
A mass absorption correction of S on Cl will correct for the effect.
6.4.3.
Select Method from the pull-down menu, then tap Regressions.
Absorption/Enhancement Corrections.

6.5. Setting Up Samples (SUSs)for Instrument Corrections

6.5.1.
When an X-ray correction is to be applied, such as blank or overlap correction, then a
sample or Setting Up Sample (SUS) must be measured before a Regression is
performed.
6.5.2.
If a Blank Subtraction has been specified, then a blank sample or SUS needs to be
measured as an instrument correction.
Hitachi High-Tech Analytical Science
Choose
47

Hide quick links:

Advertisement

Table of Contents
loading

Table of Contents