Hitachi LAB-X5000 User Manual page 20

Benchtop xrf analyzer
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3.4.1.1.
All methods stored in the instrument and available for use will be visible.
3.4.1.2.
Select the correct method, then tap
Method menu.
3.4.2.
Name the sample (if Sample Naming is active in the pull-down menu).
3.4.3.
Remove the glass cover from the sample port and insert a secondary safety window, if
there is not one already installed.
assembly, see
Section 2.6.3.5.
to accept the input and return to the
For instructions on secondary safety window
Hitachi High-Tech Analytical Science
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