Import Calibration; Test Measurement - Hitachi LAB-X5000 User Manual

Benchtop xrf analyzer

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5.5.2.1.

Intensities: A display of the original (raw) data and the corrected intensity used to

perform the regression.

(Blank, Overlap) are applied.

5.6. Import Calibration

5.6.1.

Measuring a set of calibration standards using a Hitachi pre-programmed calibration

5.6.1.1.

Pre-programmed calibrations cannot be edited or deleted.

5.6.1.2.

In order to use a pre-programmed calibration as the basis for a new one, it is

necessary to copy the pre-programmed calibration and save it as a new calibration name,

then measure an appropriate set of standards and SUSs.

5.6.2.

Importing a calibration from another LAB-X instrument.

5.7.1.

Test Measurement allows for a full spectrum scan of a sample, after which the resulting

spectrum scan can be investigated (i.e. element peaks identified, view is zoomed in or

out, saved to USB, or a second sample can be measured and the two spectra

superimposed.)

5.7.2.

Select Method from the pull-down menu, then tap Test Measurement.

5.7.3.

Sample conditions are configured prior to analysis, such as excitation conditions, filter,

and analysis time.

Corrected intensities are used when instrument corrections

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