Comparison Measurements - GE Mentor Visual iQ User Manual

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Comparison Measurements

Comparison measurements rely on the known dimensions of an object that has been
set in the field of view either by the manufacturer or by the probe or takes advantage
of known dimensions within the frozen image. The Visual iQ processor uses these
known dimensions as a reference scale for measuring an unknown target. You can take
comparison measurements on a frozen (non-3DPM) image or on a recalled image that
was saved in Comparison measurement mode.
Making a Comparison Measurement
Use the head guard or attach any standard forward-view or side-view tip to the probe.
Select the Field of View (FOV) for your tip from the soft key or the touch screen. This
allows the system to improve accuracy by compensating for the tip's optical distortion.
If FOV is not known consult Appendix
by making the surface to be measured appear perpendicular to the probe view. The
target and known object should both be in the same plane at the same distance from
the probe with the tip as close as possible while fitting them both fully into the image.
If the object and reference are small on the screen, zoom in. Freeze the display before
beginning the measurement process.
1
– Select to launch the Comparison measurement mode. Begin by selecting the
measurement type. Click here to view a table describing each measurement type.
2
– A reference of known length must next be input by placing two cursors and defining
the reference length.
3
– The reference length cursors remain.
4
– Arrange measurement cursors to determine the unknown dimension. In this case,
the system is performing a Length measurement.
each measurement type.
5
– Select to input a New Reference Dimension, Add another measurement (up to 5), or
change the active measurement (by selecting Next Measurement).
6
– Once a reference length is defined, a circle of known diameter can be displayed on
the image by selecting this option. The circle gauge may be used as a "go/no-go" gauge
when its diameter is set to a defect size limit.
B. Position the probe tip for maximum accuracy,
Click here to view a table describing
07/30/2014