Hitachi TM3030 Plus Instruction Manual page 191

2. SE (Secondary Electron)
Topographical information on a sample surface can be obtained. Every time the [SE]
button is clicked, [Standard] or [Chg-up Red.] is selected in order. The current mode will
be displayed under the [SE] button. Select a desired condition, depending on the
specimen to be observed and the observation purpose.
When [SE] is selected, the [U] mark is displayed in the information area located in the
lower right part of the image observation area. (see 4.3.2)
2a. Standard
This observation mode is suitable for observing conductive or non-conductive
sample.
When [Standard] is selected, the [M] mark is displayed in the information area located
in the lower right part of the image observation area. (see 4.3.2)
Figure 4.3.13-5 Signal Select / Observation Mode Settings (SE – Standard)
2b. Chg-up Red.
When observing non-conductive samples in the [Standard] mode, brightness /
contrast can change over time (i.e. brightness change) or image can look shifted
unexpectedly (i.e. image deviation). In such cases, it is recommended the
observation mode should be set to [Chg-up Red.].
When [Chg-up Red.] is selected, the [L] mark is displayed in the information area
located in the lower right part of the image observation area. (see 4.3.2)
Figure 4.3.13-6 Signal Select / Observation Mode Settings (SE – Chg-up Red.)
3. Mix
BSE and SE signals can be mixed to show a composite image.
When [Mix] is selected, the [M] mark is displayed in the information area located in the
lower right part of the image observation area, even though any Image mode (i.e.
[COMPO], [Shadow 1], [Shadow 2] or [TOPO]) corresponding to the [BSE] signal is
selected. (see 4.3.2)
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