Activating The Test Mode; Preparing The Connection To The Test Equipment - Hitachi RET670 Commissioning Manual

Table of Contents

Advertisement

1MRK 504 165-UEN Rev. K
a function. Also check that the wanted recordings of analog (real and calculated) and binary signals
are achieved.
During testing, observe that the right testing method, that corresponds to the actual parameters set in
the activated parameter setting group, is used.
Set and configure the function(s) before testing. Most functions are highly flexible and permit a
choice of functional and tripping modes. The various modes are checked at the factory as part of the
design verification. In certain cases, only modes with a high probability of coming into operation need
to be checked when commissioned to verify the configuration and settings.
10.2

Activating the test mode

Put the IED into the test mode before testing. The test mode blocks all protection functions and some
of the control functions in the IED, and the individual functions to be tested can be unblocked to
prevent unwanted operation caused by other functions. In this way, it is possible to test slower back-
up measuring functions without the interference from faster measuring functions. The test switch
should then be connected to the IED.Test mode is indicated when the yellow StartLED flashes.
It is important that the IED function to be tested is put into test mode, even if the MU is sending data
marked as "test". The IED will interpret these data as valid if it is not in test mode.
1.
Browse to the TESTMODE menu and press E.
The TESTMODE menu is found on the local HMI under Main menu /Test/IED test mode /
TESTMODE
2.
Use the up and down arrows to choose On and press E.
3.
Press the left arrow to exit the menu.
The dialog box Save changes appears.
4.
Choose Yes, press E and exit the menu.
The yellow startLED above the LCD will start flashing when the IED is in test mode.
10.3

Preparing the connection to the test equipment

The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24. The test switch and
its associated test plug handle (RTXH8, RTXH18 or RTXH24) are a part of the COMBITEST system,
which provides secure and convenient testing of the IED.
When using the COMBITEST, preparations for testing are automatically carried out in the proper
sequence, that is, for example, blocking of tripping circuits, short circuiting of CTs, opening of voltage
circuits, making IED terminals available for secondary injection. Terminals 1 and 8, 1 and 18 as well
as 1 and 12 of the test switches RTXP8, RTXP18 and RTXP24 respectively are not disconnected as
they supply DC power to the protection IED.
The RTXH test-plug handle leads may be connected to any type of test equipment or instrument.
When a number of protection IEDs of the same type are tested, the test-plug handle only needs to be
moved from the test switch of one protection IED to the test switch of the other, without altering the
previous connections.
Use COMBITEST test system to prevent unwanted tripping when the handle is withdrawn, since
latches on the handle secure it in the half withdrawn position. In this position, all voltages and
Transformer protection RET670
Commissioning manual
Parameters can be entered into different setting groups. Make sure to test functions
for the same parameter setting group. If needed, repeat the tests for all different
setting groups used. The difference between testing the first parameter setting group
and the remaining is that there is no need for testing the connections.
© 2017 - 2022 Hitachi Energy. All rights reserved
Section 10
Testing IED operation
M11412-2 v15
M11743-2 v9
81

Advertisement

Table of Contents
loading

This manual is also suitable for:

Relion 670 series

Table of Contents