Siemens Maxum II Manual page 36

General Maintenance and Troubleshooting
4.6 Alarm Codes, Descriptions, and Suggested Actions
# Text
371 ! Invalid channel acquisition
overlap on %3
372 ! Scheduling error %3 scan‐
ning %4 # %5 channel %6
373 ! Module I/O error %3 on %4
# %5 channel %6
374 ! Internal communication er‐
ror %3
375 ! End of cycle missed; stop‐
ping cycle
376 + Adjusting cycle clock mas‐
ter
377 ! Error %3 scheduling cycle
clock master adjustment
378 + %3 samples adjusted on
chrom from channel %4
379 ! Error %3 preparing analy‐
sis for channel %4
380 ! Error %3 finding chrom
peaks for channel %4
381 ! Error %3 generating re‐
sults for channel %4
382 ! EZChrom server failed er‐
ror %3 on channel %4
383 ? Software Watchdog Time‐
out
384 ! Method Modification Failed An attempt to modify a running method
385 ? Event occurred before
modification request
386 ! Invalid Cycle Length %3
387 ! Invalid Sample Rate %3 on
channel %4
36
Description
Two channels referencing the same
hardware detector are scheduled to ac‐
quire at the same time.
Unable to schedule all event and polling
routines. May indicate a memory or hard‐
ware failure.
Error between module and channel. Indi‐
cates obsolete anayler.
Software modules inside SNE are failing
to communicate. Usually happens with
out of memory condition resulting from
SYSCON timeout.
The message that coordinates the end of
a method around the SNE tasks was lost.
Obsolete software version.
Resource not found for scheduling ad‐
justment of event clock. SNE may be
overloaded.
An excessive number of samples re‐
quired adjustment on chromatogram. Oc‐
curs in conjunction with DPM alarms.
EZChrom processing error.
EZChrom processing error.
EZChrom processing error. Example er‐
ror: Setting the threshold value too low,
causing many peaks to be detected in
the noise of the chromatogram.
Resource problem on SNE.
SNE is running out of processing capaci‐
ty.
failed, most likely due to invalid data.
Before a modification of a running meth‐
od was completed, the event occurred.
A cycle length larger than the maximum
size was specified in a method. Usually
caused by a corrupt method. Maximum
cycle length is approximately 2 days.
Invalid sample rate value chosen for
channel in method.
Action
If multiple application detector channels
are assigned to the same hardware de‐
tector, do not allow their times to over‐
lap.
If method schedules many events as
well as all 18 detectors, try removing
some of the events or deleting some of
the detectors, then resetting the SNE.
Consider upgrading analyzer.
Reduce processing requirements on
SYSCON.
Reset SNE.
Reduce the complexity of the SNE set‐
up.
Replace SNE.
Contact Customer Support.
Reduce complexity of tasks for
SNE.Reset SNE to prevent event clock
overflow.
Replace affected DPM.
Check integration events; modify
events that may cause problems.
Check integration events and peak ta‐
ble; modify events that may cause prob‐
lems.
Check method for problems that could
affect results.
Reduce SNE workload.
Replace SNE.
Reduce SNE workload.
Replace SNE.
Verify that modification was valid.
Contact Customer Support.
Verify correct values in method.
Verify the methods and use only a sup‐
ported detector sample rate.
Maxum edition II Analyzer General Maintenance
Manual, August 2018, A5E42019842001