Hitachi Relion 670 Series Commissioning Manual page 159

1MRK506371-UUS Rev. M
11.5.4.3 Four step non-directional ground fault protection
1. Do as described in
11.5.4.4 Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.5.5 Four step negative sequence overcurrent protection NS4PTOC
(46I2)
Prepare the IED for verification of settings as outlined in section
11.5.5.1 Function revision history
Document
revision
A
B
C
D
E
F
G
H
L
M
Procedure
1. Connect the test set for injection of three-phase currents and voltages to the appropriate CT and
VT inputs of the IED.
2. Inject pure negative sequence current, that is, phase currents with exactly same magnitude,
reversed sequence and exactly 120° phase displaced into the IED with an initial value below
negative sequence current pickup level. No output signals should be activated. Check under
NS4PTOC function Service Values that correct I2 magnitude is measured by the function.
3. Set the injected negative sequence polarizing voltage slightly larger than the set minimum
polarizing voltage (default 5 % of Vn) and set the injection current to lag the voltage by an angle
equal to the set reference characteristic angle (180° - AngleRCA) if the forward directional function
is selected.
Line distance protection REL670
Commissioning manual
Section 11.5.4.2, but without applying any polarizing voltage.
Product History
revision
2.2.1 -
2.2.1 -
2.2.2 -
2.2.3 -
2.2.3 -
2.2.4 -
2.2.4 Maximum value changed to 2000.0 % of IBase for IMin1, IMin2, IMin3 and IMin4 settings.
2.2.5 -
2.2.6 -
2.2.6 Minimum value changed to 0.01 for k1,k2,k3 and k4 settings
When inverse time overcurrent characteristic is selected, the trip time of the stage will be the
sum of the inverse time delay and the set definite time delay. Thus, if only the inverse time
delay is required, it is important to set the definite time delay for that stage to zero.
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Testing functionality by secondary injection
GUID-EB1A8DFD-5BAC-4024-ADA2-D9BE7A2B50A0 v2
"Preparing for test" in this chapter.
GUID-FEAFB742-D0DA-4F9E-B4AC-84E568301282 v3
GUID-F7AA2194-4D1C-4475-8853-C7D064912614 v4
GUID-F973601F-BC67-4E4F-A4CA-BE6253E2FB92 v3
Section 11
SEMOD53296-202 v5
SEMOD53296-122 v5
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