Reliability Features - Huawei MU609 Mini Hardware Manual

HUAWEI MU609 Mini PCIe Module
Hardware Guide
Table 5-10 DC power consumption (GPS)
Description
GPS location request

5.7 Reliability Features

Table 5-11 lists the test conditions and results of the reliability of the MU609 module .
Table 5-11 Test conditions and results of the reliability of the MU609 module
Item
Low-temperature
storage
High-temperature
storage
Low-temperature
working
High-temperature
working
Damp heat cycling
Temperature shock
Salty fog test
Issue V0.1 (2013-05-16)
The above values are the average of some test samples.
Test Condition
Temperature: –40ºC±2ºC
Test duration: 24 h
Temperature: 85ºC±2ºC
Test duration: 24 h
Temperature: –30ºC±2ºC
Test duration: 24 h
Temperature: 70ºC±2ºC
Test duration: 24 h
High temperature: 55ºC±2ºC
Low temperature: 25ºC±2ºC
Humidity: 95%
Repetition times: 4
Test duration: 12 h+12 h
Low temperature: –40ºC±2ºC
High temperature: 85ºC±2ºC
Temperature change interval: < 30s
Test duration: 15 min
Repetition times: 100
Temperature: 35°C
Density of the NaCl solution: 5%±1%
Spraying interval: 8 h
Duration of exposing the module to
the temperature of 35°C: 16 h
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Max Test Value
180
Electrical and Reliability Features
Units Configuration
mA
Standard
IEC60068
IEC60068
IEC60068
IEC60068
IEC60068
IEC60068
IEC60068
38