Selective Self-Test Log Data Structure - Hitachi HDS725050KLA360 Specifications

12.42.7 Selective self-test log data structure

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
ATA generation ATA major revision specifications for byte ordering.
Table 160: Selective self-test log data structure
Description
Data structure revision
Starting LBA for test span 1
Ending LBA for test span 1
Starting LBA for test span 2
Ending LBA for test span 2
Starting LBA for test span 3
Ending LBA for test span 3
Starting LBA for test span 4
Ending LBA for test span 4
Starting LBA for test span 5
Ending LBA for test span 5
Reserved
Vendor specific
Current LBA under test
Current span under test
Feature flags
Vendor specific
Selective self-test pending time
Reserved
Data structure checksum
12.42.7.1 Feature flags
The Feature flags define the features of Selective self-test to be executed.
Bit Description
0 Vendor specific
1 When set to one, perform off-line scan
after selective test.
2 Vendor specific
3 When set to one, off-line scan after
selective test is pending.
4 When set to one, off-line scan after
selective test is active.
5-15 Reserved.
Bytes Offset
256
154
512
Deskstar 7K500 and Deskstar E7K500 Hard Disk Drive Specification
Read/Write
2 00h R/W
8 02h R/W
8 0Ah R/W
8 12h R/W
8 1Ah R/W
8 22h R/W
8 2Ah R/W
8 32h R/W
8 3Ah R/W
8 42h R/W
8 4Ah R/W
52h Reserved
152h Vendor specific
8 1ECh Read
2 1F4h Read
2 1F6h R/W
4 1F8h Vendor specific
2 1FCh R/W
1 1FEh Reserved
1 1FFh R/W
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