Internal Storage; The System Specification; The Format Specification; The Trace Specification - HP 1630A Operating And Programming Manual

Model 1630A/D/G
General Information
INTERNAL STORAGE
The 1630G has the added feature of an internal storage space which allows the user to store menu
configurations and an inverse assembler . One configuration of each menu and one inverse assembler maybe
stored at one time . The stored configurations and inverse assemblers may be specified for automatic loading
at power-up of the 1630G .
THE SYSTEM SPECIFICATION
Use the menus in this specification to identify how the analyzer will be used : whether as a state analyzer, a
timing analyzer (with or without glitch capture), or a combined state and timing analyzer . In this menu, you
also identify the waythe analyzer will operate when used as part of a system, or when using capabilities offered
by accessories.
THE FORMAT SPECIFICATION
Use the menus in this specification to set up the way the analyzer formulates displays from its captured
information . You can label individual bits or sets of bits, and assign names to identify address ranges and/or
specific values found in those labeled sets . The analyzerwill compose displays using your labels and names, if
desired .
THE TRACE SPECIFICATION
Use the menus in this specification to enter parameters for making your measurements . You can set up the
analyzer to trace state flow and/or record electrical activity at nodes in a system under test . The analyzer can
also perform overview measurements to gauge the efficiency of selected software routines .
LIST DISPLAYS
The analyzer composes lists of information captured from labeled sets of bits . These lists show a series of
soft-
ware executions, and/or a sequence of electrical activities at nodes in a system under test . Valuesshown
in these
lists can be expressed using names of your choice, as well as using numbers in the binary, octal,
decimal, and
hexadecimal number bases. Values can also be expressed as ASCII codes for labels having from 6 to 16 bits .
WAVEFORM DISPLAYS
The waveform display shows up to 16 individual traces of electrical activity on selected bits . Each trace is
shown as a continuous line of high and low states . The waveform shows how the states changed with time at
each monitored point . You can also see points on the traces where glitches were detected during the
measurement, if desired. Glitch detection is accomplished by internally combining two timing channels
attached to a single probe, using one channel for data values, and using one of the channels as a glitch
detector .
CHART DISPLAYS
The analyzer can format two types of chart displays : XY charts, and histograms . XY charts show a plot of the
flow of values on a labeled set of bits . You can control the horizontal and vertical scales of the chart to examine
the details around areas of interest on the XY chart .
Histogram charts are bar graphs used to measure the performance of software modules in a system under test .
The analyzer can show two types of histograms : state label histograms, and time interval histograms . A state label
histogram shows the relative number of executions within each range of states you define . Up to eight ranges of
states can be defined for a label histogram . Time interval histograms show eight time ranges ; you can define the
period of each range. You can set up the analyzer to make time interval measurements each time the software
executes from one selected point to another in the system under test . The time interval histogram shows how
often execution of the selected software module was completed within each of the time ranges you defined.