Nokia 6310 Manual page 28

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3.1.11. ST_BACKUP_BATT_TEST
This function tests if the backup battery was ok during power-up. Ok means that there was enough power in the
battery. If backup battery is not, ok the result is ST_FAIL. If backup battery is ok, the result is ST_OK.
3.1.12. ST_UPP_REGISTER_VER_TEST
This function compares the ASIC version with the compilation flag. Major ASIC version in UPP version register is
compared against ASIC version compilation flag. If the version is correct, the result is ST_OK. If the version is wrong, the
result is ST_FAIL.
3.1.13. ST_RF_CHIP_ID_TEST
This is the product specific self-test. Each product makes its own implementation. This test checks whether the ID
register on the RF Chip can be read and that it contains reasonable values. Usually this is done by asking RF Chip ID from
DSP. In a word, this tests the RFBUS lines (data, clock, enable) between the UPP and RF part.
3.1.14. ST_WARRANTY_TEST
This function tests the Warranty Information State. If WIS is not WT_INFO_STATE_DEF, the result is ST_OK. If WIS is
WT_INFO_STATE_DEF, the result is ST_FAIL.
3.1.15. ST_FLASH_CHECKSUM_TEST
This function calculates the checksum over flash ROM areas, and checksum is compared to precalculated checksum in
flash header. If checksums are the same, the result is ST_OK. If checksums are not same, the result is ST_FAIL.
3.1.16. ST_LCD_TEST
This function tests the connection of LCD by checking voltage level of VLCD. If voltage level is ok, the result is ST_OK. If
voltage level is not ok, the result is ST_FAIL.
3.1.17. ST_IR_IF_TEST
This function performs a self-test on the IR device. The test checks that IR energy is looped back when the module is
operating normally.
3.1.18. ST_UEM_CBUS_IF_TEST
This function checks that the connection to UEM via CBUS works. First the, value is written to UEM register and then it is
read back. The written and read values are compared with each other. If the values are the same, the result is ST_OK. If
the values are not same, the result is ST_FAIL. So basically this tests the CBUS lines (data, clock, enable) between UEM
and UPP.
3.1.19. ST_PA_TEMP_TEST
This function tests whether PA temp line AD conversion is within reasonable limits. This means that the value is not at
the bottom or top end of the scale. First, several raw values of the temperature (PATEMP) are read. Then the average is
calculated and compared to the limits. If temperature is within the limits, the result is ST_OK. If temperature is outside
the limits the result is ST_FAIL. In a word, this tests the PATEMP line between the UEM and RF.
3.1.20. ST_RADIO_TEST
This function provides a method to turn on the radio and verify that the radio chip is present. If the detection fails, the
chip will automatically turn off power. If radio supply voltage VFLASH2 is missing or FMCtrlClk and FMCtrlDa lines are not
working the result is ST_FAIL. If the radio chip is present and working, the result is ST_OK.
© NMP 2003
CONFIDENTIAL
NPE-4 6310/NPL-1 6310i
Date 22.04.2003
Checked by:
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