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15. High resolution imaging
•
Find an interesting sample area.
•
Focus the beam and sample to the crossover.
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Press [DIFF] (see Sec.9, SAED)
•
Set the sample tilt along zone-axis by seeing SAED.
•
Insert the largest objective aperture into the beam by turning the aperture handle clockwise.
•
Press [ZOOM] to see a high resolution image.
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Turn Magnification up to 300K – 700K.
•
Adjust fine focus and OBJ STIG if necessary. (see Sec.8)
•
Adjust Brightness so that Auto exposure time is between 2-5 seconds.
•
Cover the viewing window.
•
Press [Photo] to expose the film and record a bright field image.
16. Microbeam diffraction
•
Insert condenser aperture (Second aperture) and minimize the swinging beam using the condenser X/Y
adjustment screws when passing through crossover.
•
Sample tilt (see Sec.9, SAED)
•
Change the condenser aperture to forth aperture. And minimize the swinging beam using the
condenser X/Y adjustment screws when passing through crossover.
•
Adjust the objective focus, and confirm to select an interesting area.
•
Press [DIFF]
17. Exchange the sample (unloading)
•
Make sure that GV should be closed. Please remember that the unloading without closing GV cause a
lot of problems, FE-tip's fatal damage in a worst-case scenario.
•
Unloading sample holder from TEM
Follow step 5 to take it out.
2)
Close GV and pull the sample holder till it stops.
3)
Turn the sample holder clockwise till it stops.
4)
Pull the sample holder till it stops.
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