Nokia 616 Service Manual page 242

TFE-4/RV-1
TF4 Technical Information
ST_RF_CHIP_ID_TEST
This is the product specific selftest. Each product makes their own implementation. This
test should check that the ID register on the RF Chip can be read and it contains reason-
able value. Usually this is done by asking RF Chip ID from DSP. In short, this tests the
RFBUS lines (data, clock, enable) between the UPP and RF part.
ST_WARRANTY_TEST
This function tests the Warranty Information State (WIS). If WIS is not
WT_INFO_STATE_DEF the result is ST_OK. If WIS is WT_INFO_STATE_DEF the result is
ST_FAIL.
ST_FLASH_CHECKSUM_TEST
This function calculates the checksum over flash ROM areas and checksum is compared
to pre-calculated checksum in flash header. If checksums are same the result is ST_OK. If
checksums are not same the result is ST_FAIL.
ST_UEM_CBUS_IF_TEST
This function tests that the connection to UEM via CBUS is working. First the value is
written to UEM register and then it is read back. Then the written and read values are
compared together. If the values are same, the result is ST_OK. If the values are not
same, the result is ST_FAIL. So basically this tests the CBUS lines (data, clock, enable)
between UEM and UPP.
ST_PPM_VALIDITY_TEST
This function shall test the PPM validity.
ST_UPP_REGISTER_VER_TEST
This function compares the Asic version to the compilation flag. Major Asic version in
UPP version register is compared against Asic version compilation flag.
ST_BACKUP_BATT_TEST
This function tests if the backup battery was OK during power-up. This is the VWAKE
Voltage provided by the Junctionboard and supported by System-B2B connector
ST_SIM_LOCK_TEST
This function shall test the SIM Lock.
ST_LPRF_AUDIO_LINES_TEST
Here the audio lines to the Bluetooth module shall be tested.
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Issue 2.0 Mar/2005