HP A3550A - High Availability Disk Arrays Model 20 Storage Enclosure User Manual page 258

Table 6-3 Disk Array Power-Up Tests (Continued)
Test ID Test description
QST Quick Self Test (DIR)
RAM Random Access Memory Tests (DIR)
RTC MK48T0x Timekeeping (DIR)
SCC Serial Communication Controller (Z85C230) Tests (DIR)
SE Stop on Error Mode
SRAM Static Random Access Memory Tests (DIR)
ST Self Test (DIR)
TACH Tachyon Fibre Channel I/O Processor Tests (DIR)
VGA543X VGA Controller (GD543X) Tests (DIR)
VME2 VME2Chip2 Tests (DIR)
Z8536 Z8536 Counter/Timer Input/Output Tests (DIR)
ZE Zero Errors
ZP Zero Pass Count
6-10 Power-Up Troubleshooting