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Agilent Technologies 93000 SOC Series Training Manual

Agilent Technologies 93000 SOC Series Training Manual

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Page 1 Agilent 93000 SOC Series User Training Part 1 Training Manual...
Page 2 Technology Licenses The hardware and/or software described in this document are furnished under a license and may be used or copied only in accordance with the terms of such license. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 3: Table Of Contents
4-7 Set Concept 4-8 Testflow Editor 4-9 Device Files 4-10 Inside the Software 4-11 Review Test 5 Calibration 5-1 Overview 5-2 Calibration 5-3 Performing the Auto Calibration 5-4 Fixture Delay Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 4 9-2 Timing Resources 9-3 Wavetable Setup 9-4 Equation Sets and Timing Sets 9-5 Specifications (Timing) 9-6 Timing Verification 9-7 Display Signals and Using Formats 9-8 Logical Waveforms 9-9 Fixed Timing 9-10 X-modes Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 5 12 Putting It All Together 12-1 Introducing the Testflow Editor 12-2 Assigning the Global Setup Files 12-3 Inserting Testsuites 12-4 Inserting Bins 12-5 Executing the Testflow 12-6 Saving Setup Files 12-7 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 6 15-5 Testing Propagation Delay (Using Global Search) 15-6 Related Topics 15-7 Summary and Discussion 15-8 Review Test 16 Shmoo Tool 16-1 Introduction 16-2 Sweep Test Function Overview 16-3 Shmoo Plots Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 7 18-5 Information and Flags 18-6 Other Test Functions 18-7 Executing Firmware Commands 18-8 Review Test 19 Histograms 19-1 Overview 19-2 Histogram Setup 19-3 Analyzing the Results 19-4 Summary and Discussion 19-5 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 8 B Spec Sheet 74ACT299 C UNIX Commands D Linux Commands E Using vi F Pin Margin Algorithm G System File Examples H List of Abbreviations I Third Party Contact Information Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 9: Training Overview
Training Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 10 Training Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 11 W h a t yo u w i l l l e ar n After this lesson you will be familiar with the structure and concept of the training. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 12: The Training
These manual will be of particular value later on when your work on the test- floor requires information which exceeds the scope of this training. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 13: Agenda
•Q and A •“Timing Setup” (Physical Waveforms) Lesson LAB 4 - Equation Based Timing Lunch •Continue Lab 4 •“Timing Setup” (Logical Waveforms) Lesson LAB 5 - Timing - Logical Waveforms Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 14 •“Measuring Pin Margins” Lesson LAB 11 - Shmoo LAB 12 - Measuring Pin Margins (Optional) Lunch •“Advanced Testflow Control” Lesson LAB 13 - Advanced Testflow Options •“Histograms” Lesson •Class Feedback Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 15 1-2 Agenda Training Overview •LAB 14 - Histogram (Optional) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 16 Training Overview 1-2 Agenda Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 17 Test Engineer’s Responsibilities Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 18 Test Engineer’s Responsibilities Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 19 These specifications will be used in the following setup lessons. You will also learn what decisions need to be made when designing a DUT board for device testing. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 20: Test Engineer's Responsibilities
• What type of tests do I want to perform? • Do I already have a tester database for this device? • Do I have vectors/patterns available for the test? • Do I need to integrate external test equipment? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 21 Lastly, you will be responsible for several types of documentation supporting the design, implementation and use of your test program. Careful and thorough documentation will need to be provided for: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 22 Setup Setup Setup Device Device Device a DUT a DUT Board Board Result Analysis Tools Result Analysis Tools Result Analysis Tools Figure 1 Flow for setting up a device test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 23: Creating A Test Plan
• Additional serial inputs and outputs for expansion • Four operating modes: shift left, shift right, load and store • Tristate outputs for bus-oriented applications • Outputs source/sink 24 mA • TTL compatible inputs Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 24 Serial data input for right/left shift S0, S1 Mode select pins Asynchronous master reset _OE1, _OE2 Tri-state output enable inputs IO0 ... IO7 Parallel data inputs or tri-state parallel outputs Q0, Q7 Serial outputs Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 25 Setup time of the pins S0 and S1 th_CP_Iox Hold time of the io bus th_CP_Sx Hold time of the pins S0 and S1 tpd_CP_Iox Propagation delay of the io bus Figure 5 74ACT299 Timing Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 26 AC Characteristics • Setup and hold time for the various pins • Propagation delay time for all output pins (including I/O) • Clock pulse width • Reset time • Recovery time Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 27 • Input voltage sensitivity (VIH/VIL) • Output voltage sensitivity (VOH/VOL) • Power short The AC tests you will be performing will include: • Setup and hold time • Propagation delay time Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 28 Continuity OutputDC spec_func gross_func_p2 tpd_CP_IOx tpd_CP_Qx vol_voh leakage Iddq N O TE The vector label names and test names in Table 6 will be explained in later labs. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 29: Designing The Dut Board
11 Selection of Board materials 12 Socket details 13 Probe Head details 14 Die details (pad size, die size, pad-to-pad and etc.) 15 Trigger pin details if you need 16 Netlist Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 30 DUT board. When considering your overall design, remember that the combined characteristics of all components (board material, trace widths and lengths, capacitance and resistance values, etc.) will define the bandwidth limitation for signals at the DUT. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 31 A current industry trend to reduce the cost of test is to simultaneously test as many parts as possible. Identifying the need for a multi-site DUT board should be considered to reduce the test time and to better utilize the tester resources. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 32 The handler that you have planned to use can also limit the number of sites. So, planning and selecting the handler before designing the DUT board also an important task. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 33: Hardware Overview
Hardware Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 34 Hardware Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 35 After this lesson, you will have a basic understanding of the tester’s hardware concepts. You will be able to identify and locate its compo- nents, and you will have a basic understanding of the load board layout. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 36: Major Components
(no mixing of boards in a cardcage). You can mix analog and digital boards in a cardcage if your application does not require the guaranteed specs: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 37 • Compressed Air The docking mechanism is controlled by compressed air, but can also be operated manually, if required. • DC Power (385 V) • Control signals and data Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 38 (with 385V DC). • Auxiliary power supply delivering DC voltages to the power control boards in the test head, the manipulator motor, and the fan of the AC/DC cardcage. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 39 • It has hand locks and stops at most common positions. • It can compensate for droop due to the weight of the testhead. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 40 To adapt to various environments, Agilent Technologies offers several types of cooling unit solutions. The cooling unit in Figure 9, for example, is a liquid/liquid cooling system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 41 The UNIX workstation is able to communicate with the SOC Series test system. It is the operating interface between the user and the test system. Figure 10 HP UX Workstation Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 42 1 Put the line switch at the rear of the support rack into the ON posi- tion, if necessary. This switch connects the power supply to mains and powers the system control board. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 43 The cardcage is one component of the testhead. The cardcage locations for a 512-pin and 1024-pin testhead is shown in Figure 12. A detailed illustration of a 512-pin testhead with cardcage slot locations is shown Figure Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 44 Hardware Overview 3-1 Major Components Figure 12 Card Cage Locations in Small and Large Testhead Figure 13 512 Pins Testhead Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 45 Maximum analog - 24 analog modules, 640 digital pins. Maximum digital - no analog modules, 1024 digital pins Cardcage components The following list provides a brief description of all components inside a cardcage: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 46 It compares those values with VOH and VOL levels specified by the user and makes a go/no-go comparison. There are two types of compare mode, edge compare and window compare. The edge Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 47 Measurement Relay Relay Used for Pass/Fail Used for Pass/Fail Used for Pass/Fail Measurements; Measurements; Measurements; Per Pin Resource Per Pin Resource Per Pin Resource Figure 15 Pin PMU Block Diagram Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 48 M aster C lock G enerator Fiber D ata O ptic Com pression/ Link R eference Voltage Decom pression G enerator R eference Resistors High Precision P M U Figure 16 Clock Board Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 49 • Clear separation between analog and digital (lowest noise and cross talk) • Enough floor space on the load board for most complex mixed signal applications with external components on the DUT board. • Optimal layout for multi-site setups Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 50 We recommend that you use the new SOC DUT interface. This enables the full set of features of the new hardware. Due to the better layout for mixed signal testing it offers unrestricted analog specs and noise floor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 51: Software Overview
Software Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 52 Software Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 53 You will learn how to start and shut down the software and how the files containing the device test data are structured. The purpose of the windows displayed when you start the software will be discussed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 54: Smartest Test Development
Tool to analyze the behavior of a sample of critical devices and compare this overlay result to an overlay result of known good devices. This might help you identify the cause of a dropping yield. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 55 • Testflow Editor as the top level tool for testflow development. • Test Program development software to integrate external equip- ment (for example, prober, handler, data logging). • Online Documentation (see “Online Documentation” on page 58). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 56 A testflow is composed of a sequence of testfunctions and the associ- ated setup files (timing, vectors, and so on). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 57 In simple cases where you do not need equations the Level Setup Editor can be used to type in the fixed values. Of course, fixed values can also be specified in an equation-based setup. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 58: Online Documentation
The Online Documentation is a document package of the Agilent 93000 SOC Series User Manuals. You can search the full text of the Agilent 93000 SOC Series User Manuals from the first page of the online docu- mentation. The Online Documentation can be accessed via the SmarTest Report...
Page 59 AND, it finds only the first instance of the pair of words. The list of documents that have the word appears. 5 Choose the document, select View. The first occurrence of the word is displayed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 60: Running The Software
Selected Files and Directories Structure Figure 20 shows you selected 93000 files and directories that will be useful to you during the course of this class. Figure 20 Selected 93000 Files and Directories Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 61 N O T E Start the software with the “-?” option to display information on further options. Invoking the software without selecting a user mode starts the engi- neering mode. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 62: Start-Up Screen
How to Shut Down SmarTest To shut down SmarTest: 1 Click the QUIT button from the main menu pushbuttons. N O TE Make sure to save all your setups before clicking QUIT. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 63 Before invoking the kill_smarTest script, make sure you cannot exit the SmarTest software from the SmarTest user File - Quit interface (such as selecting in the main menu bar). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 64: Smartest Software Structure
Each main menu has a number of submenus. These main menus and submenus are shown in Figure Figure 22 SmarTest Software Structure The following sections describe the various pages of the main Toolbar, and the appearance of these submenus. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 65 Toolbar. Subsequent figures in this section show the buttons which appear on particular pages. Figure 23 Agilent SmarTest Main Toolbar Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 66 Setup Tools (Data Manager) The Setup tools allow you to set up a test. Results Tools The Results tools allow you to view the test results. Figure 24 Results Tools Buttons Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 67 The debug tools are used to activate the debugging aid tools. Figure 25 Debug Tools Buttons Memory Test Tools The Memory Test tools activate the memory test tools. Figure 26 Memory Test Tool Buttons Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 68 The Scan Test tools activate the device scan test. Figure 27 Scan Test Tool Buttons Analog Test Tools The Analog Test tools activate the analog / mixed signal test. Figure 28 Analog Test Tool Buttons Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 69 The Production Test tools activate the production test. Figure 29 Production Test Tool Buttons System Tools The System Tools activate the system level test support. Figure 30 System Tool Buttons Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 70: The Data Manager
The Data Manager setup page allows you to define a set of setup files and a testfunction as a Data Set. The testfunction can be executed with the associated setup data independent of the testflow. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 71 N O T E “load” means from file into hardware, “save” means from hardware into file. Result Page To switch to the Data Manager’s second page: 1 Select Select - result. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 72 As an example for these menus, let us take a look at the Data Manager menus. To find out about other windows’ menus, just play around with the system. Most of the entries are self-explanatory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 73 4-6 The Data Manager Software Overview Figure 33 Data Manager Menus Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 74: Set Concept
You cannot change setup files during testflow execution. This would be too time consuming. Rather you exchange setup sets which already reside in hardware (Downloading the timing or setup file means down- loading all the sets contained in these files.). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 75: Testflow Editor
The sets are defined in the setup files globally assigned to the testflow. The testsuite references these sets. Figure 34 Testflow Generation Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 76 The Setup Dialog box where you assign setup files globally to the test- flow allows you to access the setup editors associated with the various setup files. Figure 35 Access to Setup Editors (for example, the Level Setup Editor) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 77: Device Files
However, if you set up a test which executes tests at 10MHz as well as at 100MHz you had to combine both timings in a single timing file. As mentioned above, you cannot change files during test execution. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 78: Inside The Software
Therefore, the return can directly be used as a new command (maybe after changing some parameters). The firmware commands are discussed in greater detail in the Command Reference. Executing Firmware Commands If you want execute firmware commands, you can use Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 79 This behaves like the tester as far as possible. It also emulates device behavior with failures strewed in statistically. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 80: Review Test
The _______ __________ is the top level tool to generate a test flow assuming all the setup files are available. 5 True or False: Pressing LOAD loads a file from disk into the testhead. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 81: Calibration
Calibration Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 82 Calibration Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 83 W h a t yo u w i l l l e ar n You will learn how the calibration process is structured and what is executed on the machine during the various calibration steps. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 84: Overview
• Base Calibration • Traceable Calibration Traceable Calibration of Boards and Modules Auto Calibration of Entire Test System DC Calibration AC Calibration TDR Calibration DPS Calibration Figure 37 Calibration Flow Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 85: Calibration
When to Auto Calibrate Auto Calibration must also be performed, if one of the following components has been replaced: • any channel board Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 86 4 In the DC calibration update page, select update. The DC calibration starts, and will take about 10 - 15 minutes. Figure 38 illustrates the sequence of windows of the steps described above. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 87 5-2 Calibration Calibration Figure 38 Starting the DC Calibration Update Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 88: Performing The Auto Calibration
3 In the Calibration window, select Select - calibrate system. You see the Calibrate System page. If a calibration file is present, the filename along with the calibration date is displayed on this page. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 89 DUT interface and 3 guide holes on the stiffener. 2 Connect the 15 pin cable from the ICU to the ICU Stiffener as illus- trated in Figure 41 (p. 90) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 90 DC Calibration The Automated Calibration Progress window appears, as shown in Figure 42. First, the High Precision PMU (parametric measurement unit) calibration and the DC calibration are performed Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 91 Refer to the Report window or look up the cal_log file located in the directory /var/opt/hp93000/so/calibration for a detailed error information. AC Skew The next step is the AC skew calibration. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 92 ICU on the ICU stiffener Figure 44 Installing the ICU 2 Connect the ICU cable to the Automatic Calibration Unit connector at the side of the testhead as shown in Figure 45 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 93 The window is updated after a pair of I/O channels was calibrated. If the calibration of the pair of I/O channels was successful, the number of calibrated channels will be incremented by two. Figure 46 Skew Calibration Progress Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 94 Calibration window). The time taken for the pulse to reach the receiver is measured and compared against the value measured during the auto calibration we are discussing in this lesson. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 95 The next calibration routine performs calibration on all DPS resources within the system. Saving the Calibration Data Upon completion of the DPS calibration, a dialog window prompts you to save the calibration data. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 96 2 Print the Auto Calibration log file called: /var/opt/hp93000/soc/calibration/cal_log 3 For analysis purposes, save a copy of the Auto Calibration configu- ration file /var/opt/hp93000/soc/calibration/std__ in a different place. Note that std__ is a binary file. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 97 5-3 Performing the Auto Calibration Calibration N O T E Before you perform any IC tests, any failing PMUs or digital channels must be repaired. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 98: Fixture Delay
3 After you have measured the fixture delays you store them in a file as follows: File - Save – In the Calibration window, select You see a dialog box. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 99 Fixture delays of each channel are stored in this directory ACTCatr Contains the name of the current active channel attributes file (located in ch_attributes) pin_attributes/ Stores the pin_attributes data used for system “tweaking”. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 100 2 What is the path for the directory that contains system calibration information? 3 Which calibration accounts for the signal path delay on the load board? 4 What type of calibration information is stored with the device you are testing? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 101: Main Test Setup Components
Main Test Setup Components Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 102 Main Test Setup Components Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 103 For further information, please have a look at the following manual: • Test Setup Volume 1, Chapter 2 for information on the basic elements of a test, and the device directory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 104 Table 54 TTL and HSTL low and high states Interface Level Value Low (0) High (1) 4.5 to 5.0 V HSTL Low (0) 0.4 V HIgh (1) 1.6 to 1.8 V Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 105 Since the tester is cycle-based, you have to apply the signal in a certain format for a particular pin cycle by cycle. Since there are industry stan- dard formats to drive and compare the data, you need the timing Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 106 The pin attributes are the edge delays per pin to fine-tune the calibra- tion of the device setup. This is in some cases necessary, because there could be a time delay between the DUT and the tester pin. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 107 6-1 Basic Test Elements Main Test Setup Components The Agilent 93000 SOC Series supports 8 drive and 6 receive edge delays per pin. In addition it provides one global offset delay for all drive and receive edges. This set of 16 delays forms the pin attributes of a single pin.
Page 108 To create a device directory with the system default settings you need to perform the following actions. 1 From the SmarTest main menu, click the Change Device button. Change Device Figure 55 Change device button 2 Click the Create button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 109 Create device directory button 3 Enter the device name. 4 Click create device. 3. Device Name 4. Create Device Figure 57 Name and save the device directory 5 Click the continue button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 110 There is also one hidden file, the ",technology" file, that contains all the system Figure 59 shows an example of the directory structure. Figure 59 Example of device directory structure Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 111 See “Creating a Device Directory with User Settings” on page 112 for information on editing the default settings. Figure 60 The .technology file Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 112 1 Click the Change Device button on the main SmarTest tool bar. 1. Change Device Figure 62 Change device button 2 Click the Edit button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 113 Change device window - Edit button 3 Enter the new device name, then fill out the parameters you want to change from the default values. Figure 64 Edit device window Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 114 5 Press the continue button to finish your device setup. Figure 66 Saving user settings for the device directory Figure 67 shows an example of the device directory with user defined parameters. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 115 /dev_tech/cmos device_cycles: device_cycles: 4096 4096 waveform_sets: waveform_sets: timing_sets: timing_sets: level_sets: level_sets: dps_sets: dps_sets: pdc_sets: pdc_sets: m_sets: m_sets: 1024 1024 routing_sets: routing_sets: tester_model: tester_model: Figure 67 User defined device directory settings Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 116 Main Test Setup Components 6-2 Device Directory Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 117: Defining The Pins
Defining the Pins Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 118 Defining the Pins Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 119 (timing, levels) residing in the tester from previous programming. You will learn how to edit the pin configuration and which steps are required to avoid the loss of setup data. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 120 You specify the size of the bypass capacitor. The software automati- cally determines the corresponding operating range. • Tester Channel This specifies the Tester Channel to which the pin is connected. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 121 How to Change Pin Configuration Perform the following steps when you change the pin configuration: 1 Edit the pin configuration and download it. 2 Reload all other setups (levels, timing, vectors) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 122 If you edit the pin configuration and download it you must not save any other setup because these setup data are removed. A save would overwrite your setup files with almost no information, that is your actual setups would be lost. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 123 Figure 68 Pin Configuration Editor – Editor Mode 3 Enter the Pin Number if required. You can generate the numbers automatically by using Edit - create numbers. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 124 10101, 11405 would be valid channel specifications. Channel speci- fication 10101 indicates channel 01 of the channel board in slot 101, cardcage 1. Channel specification 11405 incicates channel 05 of the channel board in slot 114, cardcage 4. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 125 Download and save 9 When all pins have been configured, press Download to load the configuration into the tester. 10 Save the pin configuration in the Data Manager Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 126 Defining the Pins 7-3 Entering the Pin Configuration Figure 69 Channel Information of the DUT Board Design Guide Figure 70 512-pin Test Head Card Cage Numbering Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 127 2. Of course, you could also select performance range 3 with 20 µ F. This would lead to a lower voltage ripple but on the other hand it would increase the noise level. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 128 The operating range of the DPS is determined by the size of the bypass capacitor you enter in the column . R[O DPS default range: 1 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 129 This brings up the Pin Configuration window. 2 In the Pin Configuration window. select Select - groups..This brings up the Pin Group Definition Editor (Figure 71). Figure 71 Composing Pin Groups Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 130 6 If you need to change the order of any of the group members, do this using the delete paste buttons. Save 7 After the list of group members is complete, enter the group name and press save. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 131 (Figure New expression based definition 3 In the Pin Group Definition Editor, click on new expression based definition. This brings up the Expression Based Pin Group Definition window (Figure 73). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 132 If this is not the case (for example, if a new group contains input pins although it is of type o), the affected pin is marked with an star (*) in the group members field. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 133 Defining the Pins You do not have to follow the sequence of steps described above. Instead, you can directly enter the group expression, choose the component type and evaluate the expression. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 134 Defining the Pins 7-4 Defining Pin Groups Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 135 What is the IO board cardcage slot number? c What is the channel number? 6 True or False. When defining a pin group, the order of the pins does not matter. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 136 Defining the Pins 7-5 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 137: Defining The Levels
Defining the Levels Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 138 Defining the Levels Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 139 Furthermore, you will become familiar with equation sets, level sets and spec sets which are elements of the equation based setup concept and will appear again in the timing setup. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 140 These resources are programmed in the level setup. The Agilent 93000 SOC Series provides two different standard channel boards. You have to distinguish between the C- and P-channel boards and the Ce-channel board.
Page 141 Clamping (C- and P-Channel Boards vs. Ce- Channel Board) For the Agilent 93000 SOC Series two different standard channel boards exist. These different channel boards are used in the models P330, P600, P800 and P1000 (C- and P- channel boards) and in the models C200e and C400e (Ce- channel boards).
Page 142 . As the driver has an internal resistance of R = 50 Term this termination requirement is fulfilled. Since the transmission line is terminated correctly you will not have any reflections at the tester side. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 143 Figure 77 on page 143 you will find the following two different reflection coefficients: – = reflection coefficient at comparator side Comp – = reflection coefficient at device side Device Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 144 In order to define a termination voltage you have to specify vt in a level set: vt = <expression> You must not specify iol and ioh. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 145 For o and io pins, the level setup defines the high (voh) and low (vol) compare thresholds for output signals. Logic 1 Intermediate Compare Logic 0 Levels (Thresholds) Figure 78 Compare Levels Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 146 (pin configuration, level setup, timing setup and vector setup). Active Load Setup Data Required for Specifying Loads You specify the load currents (iol, ioh) and the commutation voltage (vt) in the level setup Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 147 If the termination voltage equals vil or voh the driver provides the termination voltage (see “Driver Termination” on page 142). However, in this case you do not control the driver by the entries in Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 148 1 if you want to terminate with vih and you have to drive a 0 if you want to terminate with vil. In general, the termination voltage is in the middle of the range between voh and vol. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 149: Dps (Device Power Supply) Pins
A power supply channel is connected to the DUT’s power supply pin (Vcc, see figure below). For multi-site testing you connect the different power supply channels to the power supply pins of the different sites. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 150 (close to zero). If the off state is set to (offcurr = act), the clamp current of the off state equals the CURR value specified for ilimit. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 151 0 V before the power supply voltage is set to its actual value. To power down the DPS, set the power supply voltage to 0 V, or set the DPS to tristate. Figure 82 DPS: Power Up and Power Down Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 152: Overview Of The Level Setup
• Spec variables can be accessed from testfunctions and from the Shmoo Tool. The properties listed above do not apply to equation variables. Equa- tion variables are a means to setup expressions defining the level resource values. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 153 When you setup a test you select the spec set you want to use. Changing the spec set from one test to the other allows you to execute tests with different level settings. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 154 The specific values of the level resources are calculated from the infor- mation of the • EQUATION SETS defined in the Equation Editor (see Figure 84), Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 155 • one level equation set (remember, you can define more than one equation set) • one level set of the selected equation set (an equation set can contain several level sets) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 156 Level Setup Editor. Figure 87 Level Setup Editor How many Level Sets Do You Need? You need at least one level set because you must specify the AC levels. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 157 However, in this case, you could also always use the same level set and use different spec sets. It depends on you how you prefer to structure your level data. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 158: Level Setup Steps
Select - Show DPS Eqn. & Spec Results in the Level Setup Editor. Figure 88 summarizes these steps. Figure 88 Level Setup Steps These steps are described in more details in the following sections. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 159 Let’s start with a very simple example where you define fixed levels, that is you actually do not need equations and specs. For fixed levels you would, for example for the 74ACT299, enter the following lines in the Level Equation Editor: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 160 Even if the equation set does not use any specs it is necessary to define an empty spec set. This can be accomplished in the same manner as described in section “2. Creating Level Spec Sets” on page 163. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 161 In this case you would, for example for the 74ACT299, enter the following lines in the Level Equation Editor: EQNSET 1 “EQN Set using specs and equations” SPECS vcc_level [v] vol_level [v] voh_level [v] Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 162 Data Manager. After saving the contents of the tester hardware to a file, you could shutdown the software and continue later on. Then you simply reload the file to the hardware and continue your work. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 163 2 Highlight the equation set for which you want to define a spec set. In this case, there is only one entry (equation set EQN set using specs and equations). 3 Click create. You see a dialog box headed Create Specification. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 164 The equation set EQN Set using specs and equations declares the spec parameters vcc_level, vol_level and voh_level. In the other columns, you can assign values to these spec parameters. Figure 91 Spec Tool Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 165 IO Verification Screen To display the actual DPS level values resulting from the equations and Select - Show DPS Eqn. & Specs Results. specs select Figure 93 illustrates the DPS verification screen. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 166 Then, of course, the actual level values differ from the results of the equation system. If you have overwritten a level the header part of the Level Setup Editor occurs in a different color (see Figure 94). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 167 In order to recover the levels resulting from the equation system you open the Level Equation Editor and download the equation sets (You do not have to download spec sets again.). This removes all overwrites. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 168: Using Formats
The pins will appear on the screen in this order. 4 If you need to change the order in the list, use the paste buttons. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 169 • create a format list containing each individual pin (set default) • load an existing format as a basis when defining a new format (get format) • erase all entries from the format list (clear all) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 170: Converting Levels
3 Select the All DPS Sets or One DPS Set radio button. 4 Select the desired Pins and Groups. 5 Click Create. Figure X shows a summary of these steps. Figure 96 Fixed to EBT Conversion Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 171 DPS Pins section. This is also up to the user to manage. 4 Select the desired Pins or Groups. 5 Click Create. Figure 98 shows a summary of these steps. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 172 Defining the Levels 8-6 Converting Levels Figure 98 Fixed to EBT Level Sets Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 173: Review Test
4 How do you add a new spec to a spec set? Hint: Start with the level eqn editor. 5 In the pin list of the level equation editor, how are pins delimited? a Space b Comma c Semicolon Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 174 Defining the Levels 8-7 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 175 Timing Setup Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 176 Timing Setup Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 177 (definition of waveform shapes), equation sets and the timing sets will be taught. In particular you will learn how the information of the various sets ends up in the definition of complete waveforms. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 178: Example, Timing For The Device 74Act299
74ACT299 test device. Refer to “Spec Sheet 74ACT299” on page 553 for the data sheet of this device. Figure 99 Device 74ACT299 Timing Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 179 The shapes (RZ, RO, SBC, NRZ, Strobe and so on) are defined in the Wavetable. Horizontal timing positions are defined by edge resources. The positions are defined by equations and variables. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 180: Timing Resources
• The timing setup defines waveforms for the individual pins. A waveform specifies the electrical drive or receive signal for the length of a period (for example, 5ns, 10ns, 100ns). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 181 The waveform and the index are called a physical waveform. The index is read by the sequencer during test. This enables only the selected waveform states to take part in the device test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 182 EDGES per PIN DRIVE EDGE RECEIVE EDGE DATA DATA+TRISTATE RECEIVE ACTION ACTION ACTION r1,r2,r3,r4,r5,r6 d1, d2 … d8 d1,d3,d4,d6 Figure 104 Edge Types Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 183 Assigning a HOLD (action N) to an edge makes this edge unused. PIN 1 to PIN n one tester period d1 - 8 r1 - 6 [tester period] -4000 32000 68000 104000 140000 [ns] Figure 105 Ranges for Edge Movement Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 184 • If your wavetable involves a window compare, all receive edges have to be ordered: r1, r2, r3, r4, r5, r6. Of course, you can include drive edges in any order within this sequence of receive edges. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 185: Wavetable Setup
Enter spec values for the specs declared in the equation set. Timing Verification 4 Verify the resulting timing (waveforms) in the Timing Setup Editor: Figure 107 summarizes the Timing Setup steps. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 186 Timing Setup 9-3 Wavetable Setup Figure 107 Timing Setup Steps Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 187 • 0: switch tristate off • N: do not switch tristate The drive edges d2, d5, d7, d8 require an N (F1N, F0N, N) for tristate control because these edges cannot switch tristate. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 188 The physical waveform shown below is one of the 32 possible wave- forms which are stored in the physical waveform table. Figure 109 Figure 110 show the different elements of a waveform: Figure 109 Waveform example (drive edge) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 189 You compare the device output to a certain voltage level or voltage level range at the point in time defined by the edge position. Table 111 lists the strobe compare actions. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 190 Table 112 Window Compare Actions List of Window Compare Actions compare to low compare to high compare to intermediate don’t care (mask) compare to unstable close Window Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 191 Waveform Table" on page 191 uses six edges (the drive edges d4, d2, d6, d5 and the receive edges r5, r6). Using an edge globally for all waveforms of a wavetable means that Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 192 (name). DISPLAY • The key word DISPLAY specifies the default display mode for patterns using this wavetable for the vector setup later on. You usually choose “multi”. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 193 (there is a physical wave- form table per pin) can hold a maximum of 32 waveforms. Conse- quently, the definition of physical waveforms as discussed above can require up to 32 device cycles. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 194 Figure 115 Wavetable gross_func_wtb with waveforms and edge actions for pin CP and Figure 116 Wavetable gross_func_wtb with waveforms and edge actions for pin mode, ser_in and ser_out. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 195 The wavetable allows you to overwrite the decimal numbers with arbi- trary device cycle names. This allows you to address the physical wave- forms in the Vector Setup Editor with your own (more meaningful) names. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 196 Figure 118 Defining a Pin (different Edge Delays) Figure 119 Defining a Pin (equivalent Edge Delays) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 197 When you save the wavetable changes, only the Timing icon should be shaded in the Data Manager. Otherwise you lose information. Example wavetable The source code below shows you a simple wavetable with physical waveforms: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 198 PINS _MR "d1:0 d2:1" "d1:1 d2:1" "" PINS mode ser_in "d1:0" "d1:1" "" PINS io_pins "d1:F00 r1:X" "d1:F10 r1:X" "d1:F0Z r1:L" "d1:F0Z r1:H" "d1:F0Z r1:X" "" PINS ser_out "r1:L" "r1:H" "r1:X" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 199 In this case, the sum of waveform sets and wavetables is limited by 64: ≤ number of waveform sets + number of wavetables Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 200 DCDT . Phy. Waveform Edge Device Cycle Indices Actions Names # ---------------------------------------------------------- PINS CP "d1:0 d2:0" "d1:1 d2:0" "" "" PINS _MR "d1:0 d2:1" "d1:1 d2:1" "" PINS mode ser_in "d1:0" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 201 9-3 Wavetable Setup Timing Setup "d1:1" "" PINS io_pins "d1:F00 r1:X" "d1:F10 r1:X" "d1:F0Z r1:L" "d1:F0Z r1:H" "d1:F0Z r1:X" "" PINS ser_out "r1:L" "r1:H" "r1:X" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 202: Equation Sets And Timing Sets
3 is assigned to Timing Equation Set 2 and Wavetable p is assigned to Timing Equation n. The equation set gross_func_eqn uses fixed edge values to define the edge delays. Figure 122 shows the edge delays. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 203 9-4 Equation Sets and Timing Sets Timing Setup Figure 122 Edge Delays Figure 123 explains the used syntax to create an Equation Set with fixed values. Figure 123 Equation Set and Timing Set Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 204 # no equations are used. All I/O pin resources are # directly programmed with fixed values. TIMINGSET 1 "20MHz" # period and edge delays for a 20MHz test period= 50 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 205 TIMINGSET 2 "50MHz" # period and edge delays for a 50MHz test period= 20 PINS CP d1= 7 d2= 17 PINS mode d1= 0 d2= 12 PINS ser_in d1= 1 d2= 12 PINS _MR d1= 0 d2= 8 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 206 Timing Setup 9-4 Equation Sets and Timing Sets PINS ser_out r1= 21.5 PINS io_pins d1= 1 r1= 7 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 207: Specifications (Timing)
You can define up to 99 spec sets for one equation set. Consequently, a spec set is identified by the pair (equation set number, spec set number). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 208 Select timing equation set and Create timing spec set windows. Figure 125 Specification (1) Specification definition A specification is characterized by a pair of integers: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 209 The spec variables usually are defined in combination with equations in the Equation Set. Figure 127 shows the relationship between timing sets, spec sets and wavetables. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 210 Declare a different set of variables Timing Set 1, Timing Set 1, … … Spec Set 2.1, Spec Set 2.1, … … Figure 127 Relationship of timing sets, spec sets and wavetables Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 211: Timing Verification
These two option are available on the Period, Edge Delay, Marker and Description page. The period and edge delay verification screens also allow you do modify the values resulting from the equation system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 212 Timing Setup 9-6 Timing Verification Timing Setup Editor You use the Timing Setup Editor (Figure 128) to verify the resulting timing. Figure 128 Timing Setup Editor Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 213 Select - Edge Delay. Figure 130 illustrates the edge delay verification screen. Highlight the corresponding pin or pin group in the column Pin /Group to see the edge delays of the pin/group. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 214 Edge Delay Verification Modify edge delay You can modify the edge delays by: • overwriting the delay values displayed in the row Delay [ns] > • moving the edges graphically Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 215 • Move the cursor or marker to the position of the where you want to measure the delay. The cursor/marker position is displayed in the field Offset. The field Time Delta [ns] displays the difference between the cursor and marker positions. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 216 Verification Option Description To display the descriptions of the equation set, spec set, timing set and wavetable, choose Select - Description. Figure 132 illustrates the description screen. Figure 132 Description Display Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 217: Display Signals And Using Formats
Device Cycles have the same device cycle name. To allocate device cycle names to individual pins, you have to set up a format as described in “Using Formats”, below. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 218 Now you see in the upper right corner of the Timing Setup Editor the format name that you specified in step 3. With this format you can define a Device Cycle name for each pin. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 219 9-7 Display Signals and Using Formats Timing Setup Figure 134 Setup the Format (1) Figure 135 Setup the Format (2) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 220: Logical Waveforms
Figure 136 Comparison of Physical and Logical Waveforms Relation between Logical and Physical Waveforms The logical waveforms consist of two or more physical waveforms. Some examples are shown in Figure 137. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 221 9-8 Logical Waveforms Timing Setup Figure 137 Relation between Logical and Physical Waveforms Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 222 Timing Setup 9-8 Logical Waveforms Logical Waveforms Definition of logical waveforms Figure 138 summarizes the definition of logical waveforms as described below. Figure 138 Wavetable spec_search_wtb (pin “mode”) using Logical Waveforms Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 223 The following complete wavetable defines the logical waveforms and the associated physical waveforms as follows: WAVETBL spec_search_wtb # Inputs are implemented with SBC waveforms to allow # testing of setup and hold time for input signals Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 224 DCDF R1 DCDF df PINS mode WFDS "d1:C11 d2:D11 d3:C11" WFDS "d1:D11" BWDS "d1:0" DCDF SBC DCDF DNRZ 1 DCDF df PINS ser_in WFDS "d1:C11 d2:D11 d3:C11" BWDS "" DCDF SBC Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 225 If you define logical waveforms you have to enter data parameters in the logical waveform definition in the wavetable editor. Drive data parameters Figure 140 shows an example of the drive data parameters available: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 226 Note, that the fixed drive action must match the data parameter. The following table correlates the fixed drive actions to the data parame- ters of Table 141 on page 226: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 227 Receive Data Parameters and Associated Fixed Receive Actions Receive Parameter Receive Fixed Actions (Logical Waveform) (Physical Waveform) EE1, EE2 L, H, M, X (edge compare) WE1, WE2 L, H, M, X, U (window compare) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 228 Syntax of Logical Wavetable - "mode" Example Figure 144 Figure 145 show the mode example of the logical wavetable syntax. Figure 144 Logical Wavetable Syntax - "mode" Example 1 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 229 Logical Wavetable Syntax - "mode" Example 2 The tester considers both wavetables equal, since they describe iden- tical physical waveform actions Figure 146 Physical vs. Logical Wavetable Syntax - "mode" Example Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 230 The classic mode is used as a default display mode in logical wavetables which define a single device cycle for all pins. Figure 147 shows a logical wavetable gross_func_wtb.classic which uses the classic mode. Figure 147 Wavetable Using Classic Mode Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 231 That is, every device cycle has to be defined for every pin. Figure 149 shows a logical wavet- able gross_func_wtb.single which uses the single mode. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 232 9-8 Logical Waveforms Figure 149 Wavetable Using Single Mode The wavetable gross_func_wtb.single defines the device cycles std and reset for every pin. Figure 150 shows a pattern displayed with the wavetable above. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 233 The multi mode is used as a default display mode in physical and logical wavetables which define different device cycles for different pins. Figure 151 shows an example of such a wavetable. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 234 Timing Setup 9-8 Logical Waveforms Figure 151 Wavetable Using Multi Mode Figure 152 shows a pattern displayed with the wavetable above. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 235 The pattern of Figure 152 shows data parameters for the pins io_pins, mode, ser_in and ser_out. This is only possible with a logical wavetable and not with a physical wavetable. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 236: Fixed Timing
(WFset), the current timing set (Tset), the default device cycle, and the number of displayed tester cycles (cycles). – waveform set In the waveform set, the waveform shapes are stored. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 237 Select the appropriate menu items in the menu. The display options are used for verification in the equation based setup in the Lessons later on. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 238 Timing Setup window: 1 Enter the desired period in the period edit box. The units are ns. The allowed range depends on the chosen access time of your test system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 239 8 Click into the lower portion of the entry in the column to place the selected edge beside the column. 9 Either Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 240 You see the Shapes window. The Shapes Window allows you to Select change between drive and receive shapes with the menu. Figure 156 you see the drive shapes. Figure 156 Drive Shapes Window Figure 157 you see the receive shapes. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 241 (a shape that uses no data parameters). To change break waveforms: 1 Select Select - format pins. This shows the definitions for one device cycle for all pins. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 242 For pins without a drive component you see BREAK* indicating that the BREAK device cycle is not existing for these pins. 4 Change the shapes of the break waveforms as required. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 243 Figure 159 edit device window The ratio <device cycles>/<waveform sets> yields the maximum number of device cycles you can define in a wavetable. An example is shown in Figure 160: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 244 Changing the settings for <device cycles> and <waveform sets> means that you edit the .technology file in the device directory. To be able to do this you must ensure that you have write access to this file. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 245 • C400e = 6ns (and 2ns pulse width [500 Mbit] and less EPA) • C200e = 20ns (150 Mbit) In the X5 mode: • P1000 = 4ns (1250 Mbit) • P800 = 5ns (1000 Mbit) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 246 C, D, E represents bits of data. These letters are NOT used in SmarTest. The two shapes would require 2 =8 and 2 =32 physical waveforms, to cover all possible combinations. Figure 161 X-modes Concept Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 247 9-10 X-modes Timing Setup Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 248 Timing Setup 9-10 X-modes Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 249 5 Given the following waveform definition: PINS CP "d1:0 d2:0" a What does "d1:0 d2:0" mean? b What is the device cycle name? c What is the physical waveform index? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 250 10 How do you determine the maximum number of device cycles you can define in a wavetable? 11 Why might you need to make a change to your devices .technology file? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 251 15 Explain the statement: "The EQN variables are used internally." 16 Given the following portion of a wavetable: PINS io_pins WFDS "d1:C11 d2:D11 d3:C11" WFDS "d1:F10 r1:EE1" DCDF DCDF EDGE DCDF a What are the logical waveform indices? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 252 17 What do the following drive parameters mean? What are their corre- sponding drive fixed actions for physical waveforms? b C1N c DN2 d D22 18 What is the difference between classic and single DISPLAY modes? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 253: Vector And Pattern Management
Vector and Pattern Management Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 254 Vector and Pattern Management Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 255 You will be able to use these commands, for example, to change Timing and Level Sets on the fly, or to reuse vector data. You will know the memory types and structure (architecture) of the 93000 SOC system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 256 If you want to enter vectors in the Vector Setup Editor you have to enter the device cycle names according to the base wavetable. The system then writes the corresponding hex numbers into the vector memory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 257: Putting It All Together
The vector file must reside in the vectors subdirectory of the device directory. The labels of the vector files are referenced in the individual tests (testsuites) of a testflow. This is illustrated in Figure 163. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 258 The general Pattern Management allows this approach: You can store subsets of labels in different vector files. If you want to, you can store every label in a different file (see “Pattern Management” on page 272). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 259 You should arrange the columns such that for every port the vector table shows a Device Cycle column followed by vector data columns for the various pins and pin groups (if there are any data parameters to be edited). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 260 2). 4 Click copy. The pin or pin group together with the defined columns appears in the box on the right of the Define Table Format window. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 261 You see the Select Test window. Select label and wavetable 3 In the Select Test window you select the label to be displayed and the wavetable to be used to display the label. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 262 Vector Setup Composed of Device Cycle Names and Data Parameters Defining Labels Defining a new label in the Vector Setup Editor is a similar procedure to loading a label (see “Loading a Label” on page 261). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 263 6 Click in the Display Mode entry mode, and select multi. 7 Click Select. The dialog box Select Test closes. Now you can define the vectors for the label specified in the dialog box Select Test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 264 DevCyc column in the Vector Setup Editor. Physical Waveforms should be displayed with the Multi Mode. The other Display Modes are useful with Logical Waveforms and will be explained in “Logical Waveforms” on page 307. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 265 4 Select the label you want to store in its own file. 5 In the File Name entry field, enter the name of the vector file where you want to save the label. Save 6 Click Save. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 266 Vector Setup Editor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 267 “Using User Defined Device Cycle Names” on page 266. With the modified wavetable, the pointer 5 cannot be interpreted and thus you see question marks in the Vector Setup Editor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 268 Select - select a label. 2 Click in the Wave Table edit field, and change the wavetable from gross_func_devcyc_wtb to PhysIndices. The definition of the PhysIndices wavetable is shown in Figure 173. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 269 The Device Cycle Names now appear in the Vector Setup Editor as shown in Figure 174 on page 270. The question marks and content of the Vector Setup are replaced by the device cycle names of the wavetable PhysIndices. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 270 However, a testsuite executing a burst can also be executed with the individual labels included in the burst. This can be achieved setting the unburst_mode (a testflow flag) to on or to on fail. You define a burst label as follows: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 271 Set the unburst_mode (a testflow flag) to on or to on fail. “Example: Unburst Loop” on page 505 describes how you manually set up an unburst loop. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 272 Label 3 path: Label 4 /vectors/characterization files: spec_search The label list is composed from the vector files specified in the pattern master file. Figure 176 Composition of the Label List Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 273 Path of the pattern master file: <device directory>/vectors Syntax: hp93000,pattern_master_file,0.1 path: ../../../single_patterns/74ACT299 files: gross_burst.binl gross_func.binl p1.binl p2.binl p3.binl p4.binl spec_search.binl speed.binl Figure 177 Pattern Master File Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 274 File -> Select Master File: When you select a pattern master file the software establishes the links to the vector files and generates the label list. The vector data are not downloaded. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 275 To open the Pattern Manager, double-click the Pattern icon in the Data Manager. Figure 179 shows the Pattern Manger displaying the vector files defined in the pattern master file of Figure 177 on page 273. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 276 N O TE The label you save is associated with a vector file. If you save this label, all labels of that vector file marked NOT UPTODATE are saved. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 277 Being able to load individual files saves a lot of time if you have to deal with large patterns. To load an individual vector file 1 Highlight the file you want to load in the Pattern Manager. 2 Select File - Load. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 278 "" "" "" "" "" "" "" "" "" "" In order to display the content of the vector memory you use the wavet- able above as a debug wavetable Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 279 To append a vector at the end of a label click into an arbitrary device cycle column of the line following the last vector, and enter a device cycle name. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 280 You can also copy a vector range of your vector setup and append this range. This is described in selection “Copy and Paste of Vectors” page 283. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 281 3 Type a device cycle name in the entry field Device Cycle Name for the device cycle column where you have positioned the cursor. 4 Enter the number of vectors you want to insert in the entry field Copy Factor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 282 You can delete a range of vectors at any position of your vector flow. To delete a range of vectors proceed as follows: 1 Position the cursor in any column in the first vector line of the vector range you want to delete. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 283 Proceed as follows to copy and paste vectors: 1 Select VecEdit - copy..You see the dialog box Copy. 2 Select either the insert or the overwrite radio button, depending on what you want to do. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 284 You can search and replace device cycle names or device cycle names and associated data parameters (you cannot search for just a data parameter). In order to search and replace a vector proceed as follows: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 285 The system now positions the cursor at the vector of the next match. You can also replace this vector, and so on. Global Search and Replace You can replace Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 286 Figure 186 Search and Replace in a Vector Range To search through the whole pattern and replace all matches in the whole pattern, select all vectors instead of vector range. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 287 0 and the search only includes all subsequent vectors. That is, vector 0 will not be included in the search. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 288 “;” is shown instead of each instruction, which is not displayed. You can modify the width of the sequencer instruction column in the Define Table Format dialog box (see page 261). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 289: Changing Timing And Level Sets
CLEV command. N O T E To return to the primary set as defined in the Data Manager, you can program CLEV prm. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 290 The reprogramming of the system takes time. So the system has to send break waveforms to the DUT. Make sure, you have set the BREAK waveform in the Timing Setup. After a CTIM or a CLEV the data queue is completely filled. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 291: Repeating Vectors In Loops
To stop an endless loop, you need to click the break button. There will be no pass/fail result. This instruction allows you, for example, to perform diagnostic tests using external measurement equipment while a group of vectors is executed repeatedly. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 292 N O TE The system will produce break waveforms while checking the status at MATCHEND. If a match is found, additional break waveforms are generated due to re-filling the data queue. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 293: Subroutines
Apart from this way of defining subroutines directly, the Vector Setup Editor offers the menu item Select – convert a label. This converts labels between main test labels and subroutine labels. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 294 1 In the Vector Setup Editor, click in the Instr column where the call is to be inserted. 2 Select SeqEdit - insert a subroutine call..You see the following dialog box: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 295 Instr column of the Vector Setup Editor. NOTE After changing to a new Timing or Level Set (even in a subroutine), the new set stays active until a new change appears, or until the test ends. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 296: Vector Generation
DUT. The state characters are defined in the ASCII timing file and used in the ASCII vector file. For an example excerpt of an ASCII device cycle, see Figure 190 page 297. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 297 The state characters can be selected arbitrarily (with certain restric- tions). They will not appear in the generated setup except for possibly occurring in the device cycle names within the wavetable. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 298 Thus, every combination of state character, pin, and ASCII device cycle is mapped to exactly one physical waveform index. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 299 In the second step, the vector translator converts the ASCII vector file into a binary vector file. This includes converting the state characters of the ASCII vector file into physical waveform indices. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 300 The following figure shows an excerpt of the binary vector file that the vector translator creates from the information in Figure 191 page 298 and Figure 193 on page 300: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 301 ASCII timing and vector file fragments of Figure 190 page 297 and Figure 191 on page 298. The vertical layout of the figure roughly corresponds to the temporal order. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 302 Vector and Pattern Management 10-10 Vector Generation Figure 195 Basic Translation Process of the ASCII Interface Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 303: Memory Types And Structure
A single vector requires 6 bits, there are 6 check bits per word, therefore a word of 48 bits holds up to 7 vectors. Figure 196 How Vector Memory Stores Vectors Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 304 There are actually only 36 vectors (GENV) in line number 10. The remaining bits are filled with break vectors (holding the previous state by default) to achieve the modulo 28 boundary. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 305 The checksum bits are only used internally by the tester hardware for error correction, therefore the user does not have to be concerned about the checksum bits. IMPORTANT: Do not edit the contents of this file. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 306 Vector and Pattern Management 10-11 Memory Types and Structure Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 307: Review Test
5 Why might you want to define a debug wavetable? 6 Describe the steps to append a vector at the end of a label. 7 Describe the steps to delete a vector. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 308 9 True or False. Defining subroutines can save vector memory if you have to call the same vector sequence several times in your pattern. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 309 Standard Test Functions Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 310 Standard Test Functions Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 311 O ve rview Standard test functions are the pre-written test functions provided with the Agilent 93000 SOC Series. The test functions may be executed interactively via the user interface or they may be run under the control of test flow programs.
Page 312: What Is A Functional Test
• Store the computed results in the error memory. • Set pass/fail flag and/or update result displays (error map, state list, timing diagram, and so on) from the error memory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 313 The corresponding Disconnect test function performs the disconnect sequence, which comprises the following steps: • The sequencer is set to OFF. • The device power supplies are switched off. • All existing analog resources are disconnected. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 314 OFF for an instant. Therefore, the actual state of the device is lost. AC relays and device power supplies, however, are not switched off. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 315 It can be positioned to any place within the overview error memory to display one 8K block of cycles at a time. The Detailed Error Map can be used to inspect the detailed error memory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 316: Standard Test Function Groups
• AC Tests • Sweep Tests • Other Tests • Test Control • Sequencer Control • Miscellaneous Tests Descriptions of selected tests within these groups are provided in the following sections. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 317 DUT output voltage at dc (steady state). production_iddq • production_iddq measures the quiescent power supply current of the DUT (for Production DPS models only). standby_current • standby_current measures the standby current of the DUT. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 318 The functions in this group provide high level access to low level resources: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 319 • get_utility_lines reads the state of the utility line inputs. header • header defines a header to be used for test results. set_utility_lines • set_utility_lines sets the utility line outputs. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 320 Standard Test Function Reference for test descriptions. • DAC Tests • Analog Continuity • SOC DAC Linearity • SOC DAC Distortion • ADC Tests • SOC ADC Linearity • SOC ADC Distortion • ADC TUE Linearity Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 321: The Test Control Window
Repeat Mode is used to determine how often a test should be repeated. This test function allows you to string together a group of low level firmware commands to set up and perform a test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 322 N O TE A test function which was being executed from a test flow program and has been interrupted in this way returns a state of "break". Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 323: The Continuity Test Function
However, only a test using the program- mable load can detect shortcircuits between pins. Also, for large numbers of pins, the programmable load provides a faster measurement than the PPMU, but can only return pass/fail results. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 324 Each device pin will have ESD Protection diode(s) and one IO cell. One or two reverse-biased diodes will be used in the ESD Protection Circuit. The basic test setup shown here is used to perform the continuity test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 325 • check protection circuits in the DUT such as input clamp diodes by forcing a current into a device pin and measuring the voltage between that pin and ground, • check for short-circuits. Figure 206 Continuity Test Using the PPMU Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 326 The end state for the test is disconnected. Setting up the test Select contin.cont from the Data Manager File > new menu. The Continuity Test Window is displayed as shown below: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 327 6 Enter a settling time, if required. This time is additional to the system calculated settling time, which is dependent on the current and the external capacitive loading. If no additional settling time is required, enter the value zero. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 328 Prior to execution of the test, the status of the tester is checked to determine if it is currently connected or disconnected. If it is connected, then the DISCONNECT test function is executed. If it is Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 329 • The second waveform enables tristate on for edge 1 and compare to mask for edge 2. This is the waveform used by the measured pin in the first to third cycle of the functional test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 330 Select contin.cont from the Data Manager menu. The Continuity Test Window is displayed as shown below. Figure 209 Continuity Test Window, Programmable Load Selected Select the Test Options required and then: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 331 7 Type your result text in the output entry field. The label $P will list the pin currently being measured. 8 Click exec to perform the test or break to abort it once it has started. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 332 Step 10: Click the Save Button Step 6: Select modes as required Step 8: Enter the Test Function Name Step 7: Enter parameters Step 9: Click the exec Button Figure 211 Continuity test setup 2 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 333 400 mV to detect a short. 7 The continuity test will fail if the tester sees a voltage drop that is not within the limits or if the current reaches its clamp value. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 334: Functional Test
The sequencer is started at the label specified in the data set, causing the test to run. When execution of the test function stops, the result (pass or fail), is displayed in the Report Window. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 335 File > new Select functional.fct from the Data Manager menu as shown below: Edit Edit Edit defaults defaults defaults copy copy copy paste paste paste Figure 213 Selecting a Functional Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 336 • If not already done, enter the sequencer start label in the Data Manager Window. • Start the test by clicking exec, and break to stop it if it is already running. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 337: Review Test
2 Name one test function from the Sequencer Control group and describe what it is for. 3 Name one test function from the Test Control group and describe what it is for. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 338 Standard Test Functions 11-6 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 339 Putting It All Together Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 340 Putting It All Together Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 341 W h a t yo u w i l l l e ar n After this lesson, you will be able to define a functional test by combining the various setup modules in the graphical Testflow Editor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 342: Introducing The Testflow Editor
N O TE When first starting the Testflow Editor, only the START symbol and an insertion point will be shown. Figure 215 shows a typical testflow in the Testflow Editor window. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 343 • In addition to the sets and the vector label you in general select a testfunction. In our case the testfunction always is a functional test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 344 The standard approach is the testfunction-based testflow, and this lesson is based on this approach. NOTE The only way to switch between dataset-based and testfunction-based approach is to delete the whole testflow using Edit – default. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 345: Assigning The Global Setup Files
– Enter a file name. – Click Select. You see a dialog window, allowing you to select one of the setup files stored in the corresponding setup directory of your device. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 346 This copies the content of the temporary testflow file into the test- flow subdirectory of the device directory. The file name equals the name you entered below the testflow icon. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 347 1 Double-click the testflow icon in the Data Manger. You see the Testflow Editor. 2 Select File - load setups in the Testflow Editor. You can also execute the testflow. This automatically downloads the setup files. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 348 2 In the Setup Dialog window, click into the entry field of the setup file you want to download. 3 Click Load. This downloads the file belonging to the selected line. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 349 2 If necessary, enter or change the file name in this line. 3 Click Edit. If necessary, the selected file is downloaded to the tester, you see the appropriate setup editor, in which you can modify the setup file. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 350 Putting It All Together 12-2 Assigning the Global Setup Files Figure 221 Editing Setup Files Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 351: Inserting Testsuites
Copy/Paste an existing testsuite. Define testsuite 3 Ensure that the radio button Testfunction is selected. 4 Enter the Testsuite name. 5 Select the sets and label for the testsuite: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 352 Equation, Timing Spec Set or Timing Set. The same dialog box as described above is displayed. Change the selected sets and press Select. The steps to enter to sets of the level setup are the same as for the timing sets. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 353 This downloads the setup file containing the selected set to the tester Figure 223 Downloading Setup Files from the Testsuite Dialog Window NOTE Executing a testflow also downloads the setups if necessary. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 354 This section only discusses the testflow flags you need to debug the functional test you have setup for the 74ACT299 training device. To set testsuite flags display the Flags page of the testflow editor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 355 • Flag Set fail The testsuite is executed but independent of the actual test result the testsuite is set to fail. Bypass • Flag Bypass During test execution the testsuite is bypasses. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 356 A testsuite is set to hold, if the (global global_hold) OR (the testsuite hold) are switched on. N O TE Testflow flags take priority over Testsuite flags. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 357: Inserting Bins
N O T E The dialogs for good and bad bins are almost identical. You can also toggle the bin behavior by using the Good Bin Bad Bin radio buttons. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 358 NOTE You can define an otherwise bin, which is invoked if the flow termi- (Special - otherwise nates without hitting a bin element in the Testflow Editor). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 359: Executing The Testflow
How to Execute Parts of the Testflow 1 Select the testflow elements you wish to execute. 2 Select File - execute. The selected parts are executed. The results are shown in the report window. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 360 Testsuite Dialog window has been executed. This feature is especially helpful when you debug a testflow. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 361: Saving Setup Files
The box turns empty to indicate that the changes will not be saved. When finished, click to save the selected setups. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 362 Putting It All Together 12-6 Saving Setup Files Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 363: Review Test
3 List the actions that occur during the tester’s connect sequence. 4 What are the two types of error memory available for each pin? 5 What is the difference between a testfunction-based testflow and a data set based testflow? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 364 Putting It All Together 12-7 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 365: Test Result Analysis
Test Result Analysis Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 366 Test Result Analysis Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 367 After this lesson, you will be able to run a functional test, using the vector setup and to analyze this test’s results using the available result tools: • Error Map • Timing Diagram and Softscope • State List Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 368 • Set the testsuite Hold on fail (testsuite) flag if you only want to analyze the results if the testsuite fails. Testsuite flags are discussed in section “Testsuite Flags” on page 354. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 369 You see the Error Map (Figure 229). Figure 229 Error Map Error Map User Interface The Error Map User Interface consists of the following sections (see Figure 230, below): • Menu and Icon Toolbar Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 370 The Error Map Icon Toolbar contains icon buttons providing the func- tionality of selected features of the Menu Toolbar. The Error Map Icon Toolbar is subdivided into five fields which all relate to the Menu Toolbar. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 371 • Error Map Views • Per Pin View. Figure 233 View Control area Identify errors The errors are displayed in the Error Map Views, and are highlighted by using red colored cells. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 372 All cycles or failures (depending on the Acquisition Mode) of subse- quent cells are used to fill the 8K memory of the Detailed Error Map. Figure 235 Detailed Error Map in the Overview folder Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 373 Edges Folder can be used to analyze the failures per edge. If the Failure Oriented Detailed Error Map does not use Fine Result Granularity, the test execution will be faster, but the Edges Folder cannot be used for detailed failure analysis. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 374 The Per Pin View window can be modified via the View Menu. This Menu contains a Pins Per Row submenu and an Error Count submenu. Figure 236 The Per Pin View Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 375 This mode shows the reconstructed timing based on the level and timing settings in the test. It is the fastest mode, but does not show level noise or multiple transitions (metastable states). Cycles where a pin fails are highlighted. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 376 This changes to HighRes mode and allows you to scroll to the cycles you want to examine. When you stop scrolling, the Timing Diagram automatically samples the cycles shown in the display. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 377 1 Select Display - scope size. 2 Position the window to the point of interest. 3 Press Scope. This builds up the output waveforms for all cycles currently in display. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 378 For output pins, this accurately reflects what the tester sees. On io pins, the results depend on what data are being driven by the driver, and what load is present at the DUT. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 379 This results in higher resolution on the x-axis. • For the Softscope Diagram several Functional Tests with various edge and level settings are run. This results in higher resolution on both x- and y-axis. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 380 The State List focuses on 8K cycles of received data at a time. For cycles outside the focused area question marks are shown instead of received data. The areas shaded white are those in which errors have been found. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 381 To position the state list on another section of your test, scroll the State List to the section. If there are no data available for this part, rerun the test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 382 • Error Map • Timing Diagram • State List • Vector Setup window Only those windows that are currently open are aligned. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 383 3 What are the three modes of operation in the Timing Diagram window? What are they used for? 4 What is the State List used for? 5 How do you synchronize all result displays and the vector setup window? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 384 Test Result Analysis 13-6 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 385: Device Characterization - Dc Tests
Device Characterization - DC Tests Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 386 Device Characterization - DC Tests Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 387 DC Tests • Standard Test Function Reference, Chapter 3 for information on Pin PMU and High Precision PMU • Standard Test Function Reference, Chapter 3 for information on the Active Load Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 388 Device Characterization - DC Tests 14-1 DC Test Functions 14-1 DC Test Functions The Agilent 93000 SOC Series offers a variety of standard test func- tions regarding the DC behavior of a device. To select one of the test functions: 1 Double-click the Test icon in the Data Manager.
Page 389 • Continuity and Output DC use either the PMU or the Programmable Load. Before we execute the first DC test, let us take a closer look at Pin PMU and High Precision PMU. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 390 The Pin PMU is connected to a DUT pin by closing the corresponding PPMU relay. The High Precision PMU is connected to a specific DUT pin by closing the HPPMU, ISOL and DC relay leading to that DUT pin. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 391 The availability of one PMU per pin contributes to • saving time in production and so increasing the throughput The Pin PMU addresses test requirements from continuity test, leakage test to output buffer test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 392 Pin PMU (PPMU). The PPMU can operate in all four quadrants that are possible when forcing voltages or currents (sinking or sourcing currents at positive or nega- tive voltages). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 393 PPMU are chosen such that the DUT cannot be damaged. This is possible by overvoltage -when using the current force mode- or by thermal damage -when using the voltage force mode. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 394 In contrast to the voltage force mode the PPMU can not be brought to a settled condition before the PPMU relay connects the PPMU to the DUT since the current can not flow before the DC relay is actually closed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 395 • HPPMU Relay The HPPMU relay links the High Precision PMU to the DC rail. • ISOL Relay The ISOL relay connects the DC rail to the corresponding channel board. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 396 Device Characterization - DC Tests 14-2 Per Pin PMU and High Precision PMU • DC Relay The DC relay establishes the connection to a particular channel of the channel board. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 397: Checking For Continuity And Short Circuits
How to Run a Continuity Test (PMU) To run a continuity test using the PMU: Select Continuity 1 In the Test Control window, select Continuity from the list of DC Tests. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 398 (pass volt. min and pass volt. max) If there is an internal connection between the pin and ground, the voltage detected is the forward bias voltage of the internal device protection diode. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 399 After selecting Report Mode, Test Mode, and Repeat Mode as required: Enter appropriate values 2 Type in the pins that are to be tested. 3 Click the Programmable Load radio button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 400 A compare to intermediate state is executed, therefore a pass is returned if the measured voltage lies between these two levels. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 401 14-3 Checking for Continuity and Short Circuits Device Characterization - DC Tests Figure 252 Continuity Test (Programmable Load) – Comparator Levels Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 402: Measuring Dc Output Voltages
VCC = 5.5V Power Supply Pin Power Supply Pin Output Pin Output Pin Ground Pin Ground Pin Figure 253 Circuitry for Output DC Measurements Figure 253 illustrates the output DC measurement: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 403 Table 3, “DC Output Voltages for VCC = 5.5V,” on page 402 a good device must meet the following requirements for VCC = 5.5V: VOL < 0.1V VOH > 5.4 V Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 404 Using the same primary sets and label of the gross functional test preceding the output DC testfunction ensures that the functional test of the output DC testfunction always passes if the previ- ously executed gross functional test has passed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 405 4 Select DC Tests from the dropdown menu. 5 Select the Output DC menu from the list you see. The test control page of the output DC testfunction is displayed (see Figure 256). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 406 As you can see, the output DC measurement in the defined vector range requires PPMU measurements at 9 different vectors. That is, we only partially take advantage of the parallel measurement capability: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 407 • Per pin values. • Per pin PASS/FAIL results. You specify the corresponding output by the testsuite flags. You can Figure 258). access the testsuite flags from the testsuite window (see Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 408 Returns the maximum value of VOL and the minimum value of VOH Returns the values of VOL and VOH per Returns P/F results per pin Returns a global P/F result Figure 259 Testsuite Flag Settings Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 409 - The force current (IOH or IOL) is applied, VOH or VOL is measured. 5 After the DC measurements at the first vector the sequencer steps to the next vector where the next DC measurements are executed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 410: Measuring Input Leakage
5 Enter a precharge voltage if the Pin PMU is used. 6 Enter a value for the pass minimum limit of current. Any measurement producing a result below this value is treated as failure. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 411 High Precision PMU forces the voltage and measures the current flowing. This is repeated for each pin in the pin list. After the measurement, all pins are disconnected from the dc resources and reconnected to the ac resources. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 412: Measuring Operating Current
If this is not selected, any pins that use term, load, or clp type termi- nation (according to the Level Setup) are disconnected during the test to avoid measuring the termination or load currents. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 413 If not, an error is returned instead of the measurement results. Afterwards the sequencer is stopped. If needed, the pins are returned to normal connected state (load is reconnected). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 414: Related Topics
Besides the AC and DC test functions, there are others for engi- neering, diagnostics and datalog customizing purposes. All these tests may be connected to build a complete test flow. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 415: Summary And Discussion
14-8 Summary and Discussion Device Characterization - DC Tests 14-8 Summary and Discussion In this lesson you have learned about the Agilent 93000 SOC Series standard test functions regarding the DUT’s DC behavior. You have learned • what test functions are available •...
Page 416 Device Characterization - DC Tests 14-8 Summary and Discussion Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 417: Review Test
Output on fail e Fail value Per pin on fail 4 When the 93000 runs a leakage test, it breaks the test into two parts. Describe the two parts. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 418 Device Characterization - DC Tests 14-9 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 419 Device Characterization - AC Tests Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 420 Device Characterization - AC Tests Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 421 • Standard Test Function Reference, Chapter 2 for information on AC Tests • Standard Test Function Reference, Chapter 4 for information on Sweep Tests • Equation Based Testing for information on the test functions concerning specs Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 422: Operating Principles
Parametric Functional Test you can select the algorithm to be used. Please refer to the description of the test functions in the Standard Test Functions manual to find out how an individual test is performed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 423 • setting of search range is not critical to how test is performed (and how long it takes) Disadvantages: • can be very time-consuming if many steps are required to find a fail Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 424 The test returns the pass value closest to the transition. Advantages: • very few steps needed, even for large search limits • fast • always highest possible resolution Disadvantages: • can miss anomalies in areas of large steps Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 425 Advantages: • always highest possible resolution • does not miss significant anomalies anywhere in the search range (depending on the step size) Disadvantages: • less efficient than binary search Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 426: Ac Test Functions
• Test functions to measure the frequency of a device output and to measure the jitter • Equation Based Testing: Set Spec Value and Spec Search allowing to modify and sweep specification variables. • Memory Tests: Memory Analysis and Redundancy Repair Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 427 Device Characterization - AC Tests • Beyond these, you may also use the test functions in the S WEEP group to test the device while changing two parameters simulta- neously: Shmoo 2D, Shmoo Spec. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 428: Testing Output Voltage Sensitivity
The test execution depends on the selected Test Mode: • If passed/failed is selected, the test function sets low/ high compare to the pass levels and runs a functional test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 429 N O T E In the output field you can change the text to be output for the test result. The label $P expands to the name of the pin being tested. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 430: Testing Propagation Delay
5 Enter the pass limit and unit for the propagation delay. Entering a pass value for data hold activates the data hold part of the measurement. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 431 15-4 Testing Propagation Delay Device Characterization - AC Tests Execute 6 Click the exec button. Linear/binary search is performed if there is an edge compare, binary search if there is a window compare. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 432: Testing Propagation Delay (Using Global Search)
D1, trailing edge enabled by complement of D2, edges defined in Timing Setup, and so on). 4 Select the test method from linear, binary, and lin/bin. 5 Enter the units for all values used in the test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 433 (#n). The other parameters are optional. In Figure 264, you can see the values needed to measure the propagation delay as specified. Execute 7 Click the exec button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 434: Related Topics
The special test functions available for the control and modification of spec values will be discussed in SOC Series User Training Part 2. All these tests may be connected to build a complete test flow. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 435: Summary And Discussion
• how to use a sweep test to test the behavior while changing two parameters If there have been any problems, please discuss them with the trainer and your fellow trainees. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 436: Review Test
2 What manual should you refer to for information on how an indi- vidual test is performed? 3 What does the global search test function do? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 437 Shmoo Tool Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 438 Shmoo Tool Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 439 R e l a te d D o cu m e n ts For further information, please have a look at the following manuals: • Standard Test Function Reference, Chapter 4 for information on Sweep Tests Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 440: Introduction
Shmoo tests can be set up as test functions or as standalone tests using the standalone shmoo tool. Both methods are described in this lesson. Figure 266 Smoo plot example Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 441: Sweep Test Function Overview
3 Click in the group edit box and select the entry Sweep Tests. 4 Select shmoo_2d from the list of Sweep Tests. Figure 267 Using the Sweep Test Function Enter appropriate values 5 Enter the title for the Shmoo Plot. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 442 Shmoo (very useful for programmable logic or memories). Since this test is done for each point in the Shmoo, the test time could increase significantly. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 443: Shmoo Plots
Thus, the x-axis parameter has to be changed more often than the y- axis parameter. Therefore, you should always relate the parameter with the shorter settling time to the x-axis. Figure 268 Example of a Shmoo Plot Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 444 Entry in ’test mode’ field Normal normal Fast normal (and enter ’f’ or ’F’ in front of x or y axis step size parameter) First Failing Cycle ffci Error Count erct Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 445 • First Failing Cycle Displays the first error. • First Failing Vector Displays the first failed vector. • Measured Values Displays the actual measured values. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 446 Shmoo Plot in that region only. Figure 269 Example of a Fast Shmoo Plot C A U TI O N Small “holes” between the large steps may be missed by a fast Shmoo. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 447 Figure 270 Example of an Error Count Shmoo Plot Each number of errors is allocated a color. Each test that produced the same number of errors is allocated the same color. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 448 First Failing Cycle Shmoo Plot Each different cycle that causes the first failure is allocated a color. Each test that first failed in the same cycle is allocated the same color. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 449 272. The green area of the plot passes in both tests, the blue area fails in one test, the red area fails in both tests. Figure 272 Shmoo plot overlay Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 450 2D test func- tions. Figure 273 shows the Test Control window for the shmoo_spec test. Use this window to set up your test. Figure 273 Shmoo spec test window Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 451 • Execute a testflow and set on hold the testsuite which primaries you want to use for the shmoo. • Use the Data Manager to load your setup and define the primary sets. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 452 This is the screen which you use to define the resources to be modified to produce the shmoo plot, and the test to be applied to determine the pass/fail status. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 453 Remember that you have declared the timing and level specs in the timing and level equation sets and that you have specified the corre- sponding spec values in the Timing and Level Spec Tool, respec- tively. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 454 All level hardware resources discussed in the level setup can be shmooed. Select the required resource by double clicking on the entry in the Resource Browser. The selected resource is copied to the axis resource selection box. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 455 Device Cycle field is defined. If you include a pin in the pin list which is not associated with the selected device cycle you will get an error message. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 456 (in multi mode) the subsequent pin selection only includes pins for which the device cycle in the Device Cycle field is defined. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 457 If you choose a logarithmic scale for an axis, you must choose steps instead of units for the resolution field. An execution time error message will appear if you forget to do this. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 458 Normally the resource assigned to the X-axis are the first to be incre- mented. It is possible however to select the Y-axis to be incremented first by checking the box marked Y-Axis First. Figure 281 Check Box for Order of Axes Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 459 • the number of the first failing cycle for failing tests Note that you have to select at least one result type. Otherwise, your shmoo test will not be evaluated. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 460 From Testcontrol Window. Clicking the Test icon in the Data Manager displays the actual content of this file. Make sure that you have loaded the correct testfunction for your shmoo, do not forget this second step! Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 461 16-6 Results Set -Up Shmoo Tool NOTE You can use spec parameters in a testfunction. However, if you shmoo this spec parameter it is not varied in the testfunction. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 462 You see the data file select window. You can now select any setup file you have stored so far. Figure 283 File Selection box Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 463 This menu allows you to save the setup data under a user defined name, or as either the System Default or Device Default shmoo setup data. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 464 The reduction in test duration is considerable, especially when you are performing multiple shmoo plots during device debug and character- ization activities. An example of a fast shmoo plot is shown in Figure 285. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 465 This high resolution search area is determined by the application of a special algorithm to the pass/fail results that are obtained from the initial coarse search. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 466 If you want to see a textual result that is not displayed, you have to zoom in on the cells of interest so that they are large enough to contain the text. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 467 The enlarged area is displayed as soon as the mouse button is released. Scroll bars are available to select other regions at the previously selected zoom magnification. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 468 1 Click on a result tab to select the result plot which you wish to add to the overlay display. 2 Select Result - Add to Overlay. The overlay display is automatically selected and you can inspect the updated composite overlay. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 469 Overlay screen whenever you add results to the overlay. Adding a second result to the existing overlay causes the existing overlay title to be removed. The second result’s title is copied to the overlay title and displayed above the plot. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 470 5 How do you select a fast shmoo plot? 6 What is the difference between a shmoo plot generated by the shmoo tool and a shmoo plot generated by a spec search test func- tion? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 471 7 What happens when you select fast mode for a shmoo plot? 8 What results can be obtained from the shmoo plot? 9 What can you use the overlay screen for? What are the restrictions? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 472 Shmoo Tool 16-10 Overlay Screen Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 473: Measuring Pin Margins
Measuring Pin Margins Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 474 Measuring Pin Margins Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 475 R e l a te d D o cu m e n ts For further information, please have a look at the following manuals: • Results Analysis Manual for information on Pin Margin Tool and Shmoo Tool. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 476 The pin margin test characterizes the tester and the test program. It helps you to find suitable tester settings for your production test envi- ronment. In this way you will avoid failing devices unnecessarily. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 477 • driver levels • receive thresholds • clamp voltages • load currents • termination/commutation voltages • DPS voltages (as a varying parameter of the other measurements) • DPS voltages • DPS currents. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 478: Pin Margin Setup
Margin Tool. Execute testsuite to load primary sets. Set parameters in Pin Margin window. Execute by clicking the running man icon Results appear here Figure 288 Pin Margin Tool Setup Overview Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 479 • the level range of ±0.2V is relative to actual settings • load value of 0 to 30mA (absolute values) How to change the default settings is described in the subsequent modules. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 480 2 Set up your margin settings as appropriate, and click on done when finished. See also the section “Absolute and Relative Settings” on page 480. Level 1 Select Levels in the Settings pulldown menu. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 481 Number of Elements with the tightest margins are displayed. These elements are ordered by their margins, starting with the element with the tightest margin. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 482 Selecting and Changing Primary Sets You can change the timing, level, waveform and DPS primary sets by changing either the set number or the set name. See Figure 292. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 483 If you select DPS a list of all DPS pins is shown in the left column box DPS. 3 If you have selected Pins or Groups you can include the DPS pins, by activating the with DPS button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 484 Selecting several DPS pins to be varied in 2, 4 or even 10 steps will drastically increase your test time. Selecting Pin Resources The timing and/or level options, and your preferences for them can be selected in the boxes Timing Options and Level Options. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 485 • all members of the group have identical waveforms and edges. Timing Options Timing Options Level Options Selecting Specified from the boxes opens the additional selection fields shown in Figure 188 and Figure 189 on page 288 respectively. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 486 (either as primaries or by changing sets using the sequencer command CTIM). 3 Select which edges you want to use. See Figure 297. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 487 This log file can be saved as a control file to repeat exactly these steps when you invoke the pin margin tool with the control file. To create a control file proceed as follows: Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 488 You can also edit the control file and adapt it to your needs. Figure 300 Control Log Setup Figure 301 shows an example of the Control File. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 489 17-2 Pin Margin Setup Measuring Pin Margins Figure 301 Control File Example For more details on the Control Log file, including syntax, refer to the Results Analysis Manual. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 490: Summary And Discussion
17-3 Summary and Discussion In this lesson you have learned about the SOC Series Pin Margin Tool. If there have been any problems, please discuss them with the trainer and your fellow trainees. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 491 17-4 Review Test Measuring Pin Margins 17-4 Review Test 1 What are the parameters measured using the Pin Margin Tool? 2 How many combinations of Absolute and Relative settings are there? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 492: Review Test
Measuring Pin Margins 17-4 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 493 Advanced Testflow Control Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 494 Advanced Testflow Control Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 495 OOC Rules. System flags and testflow flags will be introduced. After this lesson you will be familiar with the other groups of test func- tions available on the HP 93000 SOC Series. Furthermore, you will be able to directly send firmware commands to the system.
Page 496: Testflow Variables
Report Window during testflow execution. Implicit • Implicit Can be either Double or String. Any variable you define in an Assign Value box (Insert menu) in the testflow is of this type. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 497 The values for Implicit variables are set in the corresponding Assign Value box in the testflow. N O T E You can also use the Variables window to monitor the current values of variables during testflow execution. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 498 To indicate that an entry in the Test Control window is an expression, you have to enclose the entire expression in brackets preceded by a #. The following are valid examples: • #(@Vcc+1.5) • #(1.5+~@Vcc*1.2) • #(@period*0.9+(|@offset|+0.5)) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 499 The initial value is set to 20 A. In the Test Control window we specify the test current by this variable (see “Testflow Variables in Testfunc- tions” on page 498). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 500 The requirement now is – that the continuity test is repeated with a test current increased µ by 10 A test as long as it fails, Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 501 While Loop The same procedure for the continuity test described above can also be Insert - while loop) implemented using the while loop (select Figure 305 shows this while loop. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 502 • If the continuity passes we print the corresponding test current to the Report Window and continue with other testsuites. • If the continuity test fails we want to print “CONTINUITY FAILED” to the Report Window and bin the device. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 503 Expression in the Print Dialog window. • To print a string to the Report Window select String in the Print Dialog window and enter the string in the entry field. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 504: Built-In Functions
The has_run and has_not_run functions allow you to determine whether a testsuite in the current testflow has already run during the actual testflow execution. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 505 N O T E The testflow flag for the unburst mode is another means to execute a burst test label-by-label. Run burst test 1 Start the testflow by running the complete burst test. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 506 “lbl”, that is you assign the next label name in the sequence of burst labels to the testflow variable “lbl”. You use the built-in function burstnext to write the new label name into the Incre- ment Exp field. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 507 Figure 310 Inserting the “Unburst” Testsuite print results 5 In the branches of this unburst test, print to the datalog which tests have passed and which tests have failed. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 508 You can also assign values to spec variables from the testflow using the options • Assign Level Value • Assign Timing Value Insert from the menu. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 509 If you have to return to the initial settings for every tested device you have to reset the spec values explicitly using Assign Level Value Assign Timing Value again. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 510: Special Test Elements
The abort suite is executed when the tester gets into the abort state. This state is either chosen in the Operation Control Window (in any mode), or programmed; or occurs in cases of exception handling Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 511 INIT testsuite. – Abort is executed when a testflow is aborted. Pause – is executed when the testflow is paused. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 512 (= usercommand) permits virtually any action to be performed by a custom code. N O TE These testsuites are built of Data Sets or calls to user procedures, even if the testflow is testfunction-based. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 513: Using The Optimizer
Timing AC tests Timing AC tests are optimized by creating new Timing sets with the appropriate edge(s) set to the pass value specified in the test function. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 514 In the example shown, an Input DC (leakage) test has been optimized. The boxes contain a number of low level firmware commands sepa- rated by semicolons (;). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 515 (using PMU) output dc (using AL) production iddq standby current Table 7 AC Testfunctions Test Function Optimization Expression Support functional global search parametric functional jitter frequency spec search Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 516 All testsuites performing value tests are executed non-optimized (search tests). Using the Testsuite Flags window, a user (supervisor or engineer) can switch between pass/fail (optimized) and value (non-optimized) on the fly. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 517: Information And Flags
How to Enter Global Out Of Control (OOC) Limits 1 Select Select - global ooc rule. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 518 OOC pause test occurs. How to Access the System Flags Open System Flags window 1 Either – Select Select - System Flags. – click the button. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 519 – You can enable the graphical result display for tested wafers or packages. – You can select whether wafermaps are printed automatically. – You can enable OOC rule checking. – You can set the global sample size for the OOC rule. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 520 Test Program manual. How to Access the Testflow Flags Open Testflow Flags window 1 Either – select Select - Testflow Flags, – click the button. Figure 318 Testflow Flags Window Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 521 – You can determine whether burst labels are executed in one go, or label-by-label for failed or all testsuites. The system flags are explained in detail in the Developing a Produc- tion Test Program manual. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 522: Other Test Functions
Test Control window. It will be covered in detail later in this session. HP-UX-Escape • HP-UX-Escape This function allows you to execute a single hp-ux shell command from the Test Control window. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 523 Run). Test Control The functions in this group are used to connect and disconnect the DUT from the tester resources. These functions are normally used when you change the DUT. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 524: Executing Firmware Commands
These commands are always executed once during test execution. 6 Enter a command and its parameters in the FW-execution- command edit box. These commands may be executed more than once, depending on the Repeat Mode setting. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 525 FW-execu- tion-command string, no values can be returned. N O T E To have even more possibilities, low level programming in C or VEE is required. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 526 Advanced Testflow Control 18-7 Executing Firmware Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 527: Review Test
4 List one of the special testsuites and explain its purpose. 5 What testsuite flag allows you to put the tester in a “hold” state every time a testsuite fails? Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 528 7 Name one test function from the Sequencer Control group and describe what it is for. 8 Name one test function from the Test Control group and describe what it is for. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 529 Histograms Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 530 Histograms Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 531 R e l a te d D o cu m e n ts For further information, please have a look at the following manuals: • Results Analysis Manual for information on the Histogram Tool. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 532: Overview
• Name of bin • Type of bin (specification) • Fail results for pins • Waveform results from mixed signal tests • Pin results for cycles before and after failing cycle. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 533 • Test Data Selection Controls • Test Data Control Panel • Graphical data display screen • Graphical data selection panel • Statistical data selection and display panels • Data file control Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 534: Histogram Setup
• Population Statistics and Control The population statistics panel displays the results of the statistical calculations. These include mean value, sigma (standard deviation), Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 535 • Stop Bin Selection You can choose between any or all stop bin results to be used for the data samples. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 536 Initial Requirements Data Files When you use the histogram tool off- line, first ensure that the required data files are available on the system for the histogram tool to read. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 537 N O T E The set-up page will initially be displayed when the histogram tool is opened. Until a data source is selected all the input fields will be empty. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 538 Click on continue. g When you have gathered the data needed, click on Stop at the top of the screen. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 539 Auto Adjust All button to have the program automatically scale the display and statistics data range. The next sections contain details of how you can also make manual adjustments to these functions. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 540: Analyzing The Results
Auto(scale). Figure 324 Population Density Graph Type Legend • Solid yellow line = mean value • Solid red line = test limits • Broken white line = std dev (sigma) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 541 This type of display shows the deviation of the data distribution from a perfect gaussian distribution. The y-axis scale is transformed by the program so that the deviations from a true gaussian distribution are shown above or below a horizontal line, y=0. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 542 2 Use the button to set the new overlay data or click Clear to clear 3 The Count/Bin (Overlay) button switches the cursor to map either the current data or the overlay. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 543 19-3 Analyzing the Results Histograms Figure 327 Overlay Screen Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 544 Open Offline Datalog File Overview 1 Click File > Open. 2 Select the Datalog Type, then click OK. 3 Locate the File in the Open Datalog File menu. 4 Click Open. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 545 Result No: Samples: Bin Width: 0.0005 MinVal: 5.46 MaxVal: 5.4685 5.46025 5 |***** 5.46075 4 |**************** 5.46125 6 |**** 5.46175 2 |************* 5.46225 1 |**** 5.46275 2 |** 5.46325 0 |** Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 546 The column of numbers to the right of the histogram are the y- axis values. See Figure 329. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 547 5.46225 1 |**** 5.46275 2 |** 5.46325 0 |** 5.46375 0 |** 5.46425 5.46475 5.46525 5.46575 5.46625 0 |** 5.46675 5.46725 2 |** 5.46775 5.46825 Figure 329 ASCII Histogram Results Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 548: Summary And Discussion
If there have been any problems, please discuss them with the trainer and your fellow trainees. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 549: Review Test
3 True or False. To see the histogram properly you have to rotate the sheet of paper on which the report is printed by 90º in an anti-clock- wise direction. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 550 Histograms 19-5 Review Test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 551 Appendices Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 553 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 554 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 555 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 556 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 557 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 558 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 559 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 560 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 561 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 562 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 563 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 564 Spec Sheet 74ACT299 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 565 UNIX Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 566 UNIX Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 567 W h at yo u wi l l l e a rn After this review, you will be able to perform basic UNIX commands this is necessary to use the 93000 test system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 568 With the cd command you can use .. to specify the directory directly above your current directory. For example, type: cd .. The result is that you change to the directory one level up from the directory you started with. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 569 (lower level directories are included in the search) and filename is the name of the file you are trying to locate. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 570 When you extract the files, the original directory and subdirectory structures are restored. You can also compress or zip files to make them smaller. See the refer- ence card for more information. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 571 The -k option to man does a “keyword” search for the string you type between single quotes. This option only works if your system adminis- trator has set up keyword files in UNIX. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 572 UNIX Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 573 Linux Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 574 Linux Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 575 W h at yo u wi l l l e a rn After this review, you will be able to perform basic Linux commands this is necessary to use the 93000 test system. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 576 Linux. To create an alias, type alias ll = ’ls -l’ man <linux-command> Show definitions of available options. mkdir <directory-name> Make directory. mv <old-name> <new-name> Rename a file/directory. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 577 -xvf <file-name>.tar Extract an archive of files. Show who is logged on. xhost + Set the Workstation to accept the display of windows from programs running on oth- er Workstations. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 578 Generate object code for a specific version of the +DA model -march=cputype architecture processor, where cputype is the CPU type (such as i386 or i486). Perform instruction scheduling for a particular model of +DS model mschedule=cpu_type architecture processor. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 579 Provide migration warnings for transitioning code from the ILP32 to the LP64 data model. Print hexadecimal code offsets in the source code listing. Control pointer alignment, where bytes is 1, 2, or 4. +ubytes Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 580 . –E Perform only preprocessing with the output sent to stdout . –fallow–single–precision +r or +f Inhibit the automatic promotion of float to double . Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 581 –nostartfiles not available Do not use the standard system start-up files when linking. –nostdlib not available Do not use the standard system start-up files or libraries when linking. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 582 Undefine name in the preprocessor –v –v Enable verbose mode. -V version not available Specify which version of GNU CC to run (defined by the argument version ). –w –w Suppress warning messages. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 583 HP-UX compiler options, please consult your man pages. –Wtraditional Provides ANSI migration warnings that ex- plain the differences between code com- piled with -Ac and -Aa . Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 584 Linux Commands Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 585 Using vi Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 586 Using vi Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 587 1G moves the cursor to the first line Inserting Text a appends text after the cursor inserts text before the cursor Undoing Commands u undo last command U restore current line to original state Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 588 When you are finished editing in dtpad, save the file in your home directory. Call it text. In the HPSmarTest vi editor, read in that file using the command :r ~/text. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 589 Pin Margin Algorithm Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 590 Pin Margin Algorithm Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 591 This section contains a more detailed look at the measurement algo- rithm, and how the measurement is determined. For complete information regarding the Pin Margin Tool, refer to the Results Analysis Manual, "Measuring Pin Margins". Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 592 • driver levels • receive thresholds • clamp voltages • load currents • termination/commutation voltages • DPS voltages (as a varying parameter of the other measurements) • DPS voltages • DPS currents. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 593 (see “Binary Search Algorithm” on page 595) is only performed at the pass/fail transition closest to the actual value in each direction 5 The original tester settings are then restored. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 594 The number of steps can be chosen between 2 and 50. The default number of steps is 50. This technique is shown in Figure 331 (p. 595). Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 595 This is illustrated in Figure 332. Fail value Specified start value Search limit Value returned = test performed Figure 332 Binary Search Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 596 This search method needs less steps than a linear search and so it is faster. It also detects the transition value using the highest resolution. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 597 System File Examples Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 598 System File Examples Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 599 The following files are covered in this section: • Level File • Timing File • Calibration File • Environment Setup Files • Org File • Device In Use File • Model File Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 600 System File Examples Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 601 # derrived from dps set 1 "5V" DPSPINS Vcc vout ilimit = 1010 t_ms offcurr= act LEVELSET 1 "5V - no termination" # derived from level set 1 PINS ctrl ser_in vil= 0 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 602 2.4 voh= 2.6 vt = 2.5 iol= 24 ioh= 24 PINS io_in vil= 0 vih= 4.8 vol= 2.4 voh= 2.6 vt = 2.5 iol= 24 ioh= 24 EQNSET 2 "specs" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 603 PINS ser_out vol= VOL voh= VOH vt = (VOL+VOH)/2 PINS io_in vil= VIL vih= VIH vol= VOL voh= VOH LEVELSET 3 "active load" # third Level Set with load current 24mA Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 604 SPECSET 1 "generated" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT EQNSET 2 "specs" SPECSET 1 "Vcc = 4.5V" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT SPECSET 2 "Vcc = 5.0V" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 605 System File Examples # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT SPECSET 3 "Vcc = 5.5V" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 606 WAVE 1,1,F10,,FX,,9,(I/O7,I/O6,I/O5,I/O4,I/O3,I/O2,I/O1,I/O0) BWDS 1,,,"d1:F00",(CP) BWDS 1,,,"",(DS7,DS0,S1,S0) BWDS 1,,,"d1:F10",(_MR) BWDS 1,,,"",(I/O7,I/O6,I/O5,I/O4,I/O3,I/O2,I/O1,I/O0) ETDS 1,1,,"d1:10 d2:14",(CP) ETDS 1,1,,"d1:3.5 d2:5.5 d3:11.5",(DS7,DS0) ETDS 1,1,,"d1:1 d2:3 d3:11",(S1,S0) ETDS 1,1,,"d1:3.5 d2:7",(_MR) ETDS 1,1,,"r1:22",(Q7,Q0) ETDS 1,1,,"d1:4 d2:6 d3:11.2 r1:22",(I/O7,I/O6,I/O5,I/O4,I/O3,I/O2,I/O1,I/O0) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 607 (hold) drive 0, hold tri-state drive 1, hold tri-state turn off tri-state turn on tri-state drive 0 drive 0, turn on tri-state drive 1 drive 1, turn on tri-state Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 608 Indices Actions # --------------------------------------- PINS CP "d1:0 d2:0" "d1:1 d2:0" "" PINS _MR "d1:0 d2:1" "d1:1 d2:1" "" PINS mode ser_in "d1:0" "d1:1" "" PINS io_pins "d1:0 r1:X" "d1:1 r1:X" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 609 "d1:1 d2:1" "" PINS mode ser_in "d1:0" "d1:1" "" PINS io_pins "d1:0 r1:X" "d1:1 r1:X" "d1:Z r1:L" "d1:Z r1:H" "d1:Z r1:X" "" PINS ser_out "r1:L" "r1:H" "r1:X"X #-------------------------------------------------------------------- WAVETBL spec_search_wtb Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 610 PINS ser_out "r1:L" "r1:H" "r1:X" PINS io_pins "d1:1 d2:0 d3:1" SBC_0 "d1:0 d2:1 d3:0" SBC_1 "d1:1 r1:L" "d1:1 r1:H" "d1:1 r1:X" #---------------------------------------------------------------- # Logical Waveforms used in Lesson "Logical Waveforms" #---------------------------------------------------------------- Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 611 WFDS 1 "d1:D11 d2:F1N" BWDS "d1:F10" DCDF DNRZ DCDF SBC PINS ser_out WFDS 0 "r1:EE1" WFDS 1 "r1:EE1" DCDF DNRZ DCDF SBC PINS io_in WFDS 0 "d1:C11 d2:D1N d3:C1N r1:EE1" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 612 "" DCDF .0 DCDF p PINS _MR WFDS "d1:0 d2:1" WFDS1 "d1:1" BWDS "" DCDF r DCDF . PINS mode WFDS "d1:D11" BWDS "" DCDF op PINS ser_in WFDS "d1:D11" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 613 DISPLAY classic DCDT std PINS CP WFDS0 "d1:D11 d2:0" BWDS "" DCDF std0 PINS _MR WFDS "d1:D11 d2:1" BWDS "" DCDF std PINS mode ser_in WFDS "d1:D11" BWDS "" DCDF std Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 614 WFDS "" BWDS "" DCDF std0 DCDF reset PINS _MR WFDS "d1:D11 d2:1" BWDS "" DCDF std PINS mode ser_in WFDS "d1:D11" WFDS1 "" BWDS "" DCDF std DCDF reset Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 615 # This table is for debugging purposes only. # It uses physical waveforms with device cycles. PINS all_in all_out "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" "" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 616 = 0 d2 = 15 PINS ser_out r1 = 45 PINS io_pins d1 = 2 r1 = 45 TIMINGSET 2 "50MHz" # Period and edge delays for a 50MHz test Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 617 #----------------------- Spec Unit # variables #----------------------- [MHz] ts_Sx_CP [ns] th_CP_Sx [ns] ts_IOx_CP [ns] th_CP_IOx [ns] ts_DSx_CP [ns] th_CP_DSx [ns] tw_CP [ns] tw_MR [ns] trec_MR_CP [ns] tpd_CP_Qx [ns] tpd_CP_IOx [ns] EQUATIONS Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 618 = CP_ref - ts_IOx_CP - ComplDelay d2 = CP_ref - ts_IOx_CP d3 = CP_ref + th_CP_IOx r1 = CP_ref + tpd_CP_IOx EQNSET 3 "generated_eqnset" # period_res= 10 TIMINGSET 1 period= 20 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 619 22 EQSP TIM,SPS,#9000002516 EQNSET 1 "gross_func_eqn" WAVETBL "gross_func_wtb.classic" CHECK all SPECSET 3 "gross_func_specs_classic" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT tpdIOx [ ns] WAVETBL "gross_func_wtb.single" CHECK all SPECSET 4 "gross_func_specs_single" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 620 [ ns] th_CP_IOx [ ns] ts_DSx_CP [ ns] th_CP_DSx [ ns] tw_CP [ ns] tw_MR [ ns] trec_MR_CP [ ns] tpd_CP_Qx 13.5 [ ns] tpd_CP_IOx [ ns] EQNSET 1 "gross_func_eqn" Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 621 SPECSET 2 "gross_func_devcyc_specs" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT tpdIOx [ ns] EQNSET 3 "generated_eqnset" WAVETBL "spec_search_logical" CHECK all SPECSET 1 "generated_specs" # SPECNAME *****ACTUAL***** *****MINIMUM**** *****MAXIMUM**** UNITS COMMENT Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 622 This file is for Analog Instrument Calibration only. Two sets of Calibration Data are necessary to accommodate the model files variations. This is due to newly added Features and HW among HPSmarTest Versions; e.g. NP2500, FlexDC, etc. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 623 ‘hpt’ will not require the full path to execute. HPSmarTest Related Files PATH=$PATH:/opt/hp93000/soc/prod_env/bin PATH=$PATH:/opt/hp93000/soc/com/lbin PATH=$PATH:/opt/hp93000/soc/pws/bin PATH=$PATH:/opt/hp93000/soc/pws/data PATH=$PATH:/opt/hp93000/soc/fw/bin PATH=$PATH:/var/opt/hp93000/soc/diagnostic PATH=$PATH:/var/opt/hp93000/soc/calibration PATH=$PATH:/etc/opt/hp93000/soc Xservers Files and HP-UX Binary Files PATH=$PATH:/usr/local/bin/X11 PATH=$PATH:/usr/bin/X11 PATH=$PATH:/usr/local/bin PATH=$PATH:/usr/sbin PATH=$PATH:/sbin Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 624 Searches recursively for devices starting from the specified directory # THIS_TESTER_ONLY Limit the search for device dircetory to the local tester WORKORDER_PATH /users/demo:/training/s1 Defines a workorder search path (as well as the environment variable WORKORDER_PATH) Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 625 A temporary file (.device_inuse_soc) is created under the user’s home directory while running SmarTest that points to the current device in use. When the SmarTest software is started, the device listed in the .device_inuse_soc file will be opened. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 626 5 Sets the configuration of the test system from the model file contents and given licenses. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 627 `->| - |->| ch_2 |-+->| : |-+------------------------. `---' `------' `---' | ,--------------. `-+->| ioch_feature |-. `--------------' | ,---. `-------| , |<------+->+ `---' `----------------------------------------------------------------+------->+ ,-------------. +->| ANALOGBOARD |-+---------------------------------------------------------------------->+ `-------------' | ,------. +->| bd_1 |-+------------------. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 628 (30 is the default logical unit for LAN) - HPIB,lan[<IP-address>]:hpib ... Lan HPIB box with IP address <IP-address> # <ch_1>,<ch_2> ::= <board><channel> # <board> ::= 101..132, 201..232 # <channel> ::= 01..16 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 629 11105-21416: sram = 2M, sdram = 28M 21701-22416: sram = 2M, sdram = 28M ANALOGBOARD 225: type = TIA, core=2 226: type = SPA, core=2 227: type = WDA, core=1 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 630 SOCGPIB : iftype=GPIB, driver=sicl, addr=hpib2 NFSSERVER : ipaddr=192.168.0.1 1-3: type = GPDPS 1-2: type = GPDPS 2-8: type = GPDPS type = HP6624A, address = 6 OSCILLOSCOPE 1: type = HP54503A, address = 8 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 631 List of Abbreviations Appendix H Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 632 List of Abbreviations Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 633 Parametric Measuring Unit PPMU Pin Parametric Measurement Unit Surrounded By Complement Semiconductor Contract Manufacturer System On a Chip SPMU System Parametric Measurement Unit Time Domain Reflectometery Trailing Edge Test Function Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 634 List of Abbreviations Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 635 Third Party Contact Information Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 636 Third Party Contact Information Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 637 Third Party Contact Information In this Lesson ... O verview This is contact information for third party vendors who provide funda- mental classes for digital testing. Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 638 Third Party Contact Information Third Party Contact Information Soft Test, Inc. www.soft-test.com Giga Test Labs www.gigatest.com Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 639 Error Count Shmoo Plot 447 Loop Definitions 499 Error Map 369 Data Manager 70 Error Memory 315 Menus 72 Error Messages 79 Main Toolbar 65 Program Page 72 Execute Testflow 359 man Pages 571 Agilent 93000 SOC Series User Training Part 1, October 2004...
Page 640 Scan Test Tools 68 Sequencer Control 523 Sequencer Instructions 288 Unburst loop 507 Setup files 56 UNIX workstation 41 Setup Tools 66 Unterminated Transmission Line 144 Shapes 240 User Mode 61 Agilent 93000 SOC Series User Training Part 1, October 2004...

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