Head, Probe, & Sample Preparation - Veeco Dimension 3100 Manual

Nanoscope software version 5, 004-320-000 (standard), 004-320-100 (cleanroom)
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Chapter 7 Head, Probe, & Sample
This chapter includes information regarding the Dimension 3100 Scanning Probe Microscope
(SPM) setup and operation procedures for Contact Mode and TappingMode. Specifically, this
chapter details removal and installation of the microscope head, mounting the cantilever, changing
the tip, loading and positioning samples, focusing the optics, and general information regarding
engaging and withdrawing the tip.
Chapter 9
discusses SPM operation in TappingMode in more detail, while
operation in Contact Mode AFM. This chapter contains the following:
Rev. D
Preparation
System Information:
Section 7.1
Mouse versus Trackball:
Motor Interlock:
Section 7.1.2
Laser Requirements:
Basic AFM Operation:
Select the Microscope:
Select Mode of Operation:
Prepare the Cantilever Holder:
Load the Cantilever Holder:
Remove the Dimension SPM Head:
Install the Cantilever Holder:
Replace the Dimension SPM Head:
Connect the Dimension Head:
Align Laser:
Section 7.2.9
Adjust Photodetector:
Locate Tip:
Section 7.2.11
Dimension 3100 Manual
Section 7.1.1
Section 7.1.3
Section 7.2
Section 7.2.1
Section 7.2.2
Section 7.2.3
Section 7.2.4
Section 7.2.5
Section 7.2.6
Section 7.2.7
Section 7.2.8
Section 7.2.10
Chapter 8
reviews SPM
99

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