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12 Introduction to the manual
Terms and abbreviations
Term
Cat.
CCF
D8T
DC
DI
DIIL
E-stop
FIO-01
Frame, frame size
HFT
IGBT
PFD
avg
PFH
PL
RO
SC
SIL
SILCL
T1
Description
Classification of the safety-related parts of a control system in respect of their resistance
to faults and their subsequent behavior in the fault condition, and which is achieved
by the structural arrangement of the parts, fault detection and/or by their reliability.
The categories are: B, 1, 2, 3 and 4. (EN ISO 13849-1)
Common cause failure (%) (EN ISO 13849-1)
Frame size designation of the diode supply module
Diagnostic coverage (EN ISO 13849-1)
Digital input
Digital input interlock
Emergency stop
Optional digital I/O extension module
Physical size of the drive or power module
Hardware fault tolerance (IEC 61508)
Insulated gate bipolar transistor
Average probability of dangerous failure on demand (IEC 61508)
Average frequency of dangerous failures per hour (IEC 61508)
Performance level. Levels a...e correspond to SIL (EN ISO 13849-1)
Relay output
Systematic capability (IEC 61508)
Safety integrity level (1...3) (IEC 61508)
Maximum SIL (level 1...3) that can be claimed for a safety function or subsystem
(IEC/EN 62061)
Proof test interval. Defines the probabilistic failure rate (PFH or PFD) for the safety
function or subsystem. Performing a proof test at a maximum interval of T1 is required
to keep the SIL capability valid. The same interval must be followed to keep the PL
capability (EN ISO 13849) valid. Note that any T1 values given cannot be regarded
as a guarantee or warranty.
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