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Section 11
Testing functionality by secondary injection
Document
revision
D
E
F
G
H
Procedure
1.
Connect the test set for injection of three-phase currents and voltages to the appropriate CT and
VT inputs of the IED.
2.
Inject pure negative sequence current, that is, phase currents with exactly same magnitude,
reversed sequence and exactly 120° phase displaced into the IED with an initial value below
negative sequence current pickup level. No output signals should be activated. Check under
NS4PTOC function Service Values that correct I2 magnitude is measured by the function.
3.
Set the injected negative sequence polarizing voltage slightly larger than the set minimum
polarizing voltage (default 5 % of Vn) and set the injection current to lag the voltage by an angle
equal to the set reference characteristic angle (180° - AngleRCA) if the forward directional function
is selected.
If reverse directional function is selected, set the injection current to lag the polarizing voltage by an
angle equal to RCA.
4.
Increase the injected current and note the value at which the studied step of the function trip.
5.
Decrease the current slowly and note the reset value.
6.
Block lower set steps when testing higher set steps according to the instructions that follow.
7.
Connect a trip output contact to a timer.
8.
Set the injected current to 200% of the trip level of the tested step, switch on the current and check
the time delay.
For inverse time curves, check the trip time at a current equal to 110% of the trip current in order to
test parameter txmin.
9.
Check that all trip and pickup contacts trip according to the configuration (signal matrixes)
10.
Reverse the direction of the injected current and check that the step does not trip.
11.
Check that the protection does not trip when the polarizing voltage is zero.
12.
Repeat the above-described tests for the higher set steps.
13.
Finally, check that pickup and trip information is stored in the event menu.
11.4.3.2
Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
110
Product
History
revision
2.2.3
-
2.2.3
-
2.2.4
-
2.2.4
Maximum value changed to 2000.0 % of IBase for IMin1, IMin2, IMin3 and IMin4 settings.
2.2.5
-
When inverse time overcurrent characteristic is selected, the trip time of the stage will be
the sum of the inverse time delay and the set definite time delay. Thus, if only the inverse
time delay is required, it is important to set the definite time delay for that stage to zero.
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1MRK 511 409-UUS Rev. K
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GUID-F973601F-BC67-4E4F-A4CA-BE6253E2FB92 v3
SEMOD53296-122 v5
Phasor measurement unit RES670
Commissioning manual
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