Test Circuit - Toshiba T6K04 Handbook

Cmos digital integrated circuit silicon monolithic column row driver lsi for a dot matrix graphic lcd
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DC Characteristics (3)
(Test condition: If not specified, V
Item
Op-Amp Output
Voltage Offset (1)
Op-Amp Output
Voltage Offset (2)
Note 1: V
= 3.0 V, V
DD
DC-DC OFF, LCD out pin No Load
V
pin: V
LC1
V
pin: V
LC2
V
pin: V
LC3
V
pin: V
LC4
V
pin: V
LC5
Note 2: V
= 3.0 V, V
DD
DC-DC OFF, LCD out pin No Load
V
= ( (V
opoffs

Test Circuit

(1) Doubler mode
= 0 V, V
SS
Test
Symbol
Circuit
V
opoff
V
opoffs
= 0 V, 1/9 bias, 1/64 duty, V
SS
− |V
− V
| × 1/9 = V
DD
DD
EE
− |V
− V
| × 2/9 = V
DD
DD
EE
− |V
− V
| × 7/9 = V
DD
DD
EE
− |V
− V
| × 8/9 = V
DD
DD
EE
− |V
− V
| = V
DD
DD
EE
opoff
= 0 V, 1/9 bias, 1/64 duty, V
SS
− V
) − (V
− V
LC1
LC2
DD
= 2.7 to 3.3 V)
DD
Test Condition
Min
(Note 1)
−150
(Note 2)
−100
= −9.5 V, Contrast control = Max, Op-Amp ON,
EE1, 2
opoff
opoff
opoff
opoff
= −9.5 V, Contrast control = Max, Op-Amp ON,
EE1, 2
) ) + ( (V
− V
) − (V
LC2
LC3
LC4
Typ.
Max
Unit
150
mV
100
mV
− V
) )
LC4
LC5
2001-03-13 27/30
T6K04
Applicable
Terminal
V
V
LC1,
LC2,
V
V
LC3,
LC4,
V
LC5
V
V
LC1,
LC2,
V
V
LC3,
LC4,
V
LC5

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