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Toshiba TC32306FTG Manual page 85

Single-chip rf transceiver for low-power systems

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12
11
50 Line
9
50 Line
Test Characteristics: G
v (LNA)
Fig 11-4 Test Circuit (LNA Gain)
Signal
35
Source
Fig 11-6 Test Circuit (RF-Transmitting)
Measuring
Iinstrument
Signal
Source
50 Line
18
17
16
12
Measuring
35
Instrument (a)
6
Measuring
Instrument (b)
Test Characteristics: DR
* Measure DRfm by connecting (a).
Measure V
/V
/V
RSSI1
RSSI2
Fig 11-5 Test Circuit (RF-Receiving)
Measuring
Iinstrument
Test Characteristics: P
* In ASK, measure by connecting the signal source to 35 pin.
In FSK, measure by setting 35 pin to low level. (Set to
unmodulated by register)
85
TC32306FTG
12
11
50  Line
V
V
V
fm,
RSSI1,
RSSI2,
RSSI3
by connecting (b).
RSSI3
TX (315)1
2015-10-01
Signal
Source

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