GE AKR-30 Series Maintenance Manual page 64

SECTION 1 2-MicroVersaTrip™ Trip Device (Cont.)
1 2.3 FLUX SHIFTER TRIP DEVICE
The only difference between the MicroVersaTrip and
SST flux shifter trip devices is the solenoid winding. Refer
to Section 1 0.3 for details.
When replacing a MicroVersaTrip flux shifter, AMP ex­
traction tool Cat. No. 45582 2 - 2 Is required to remove the
socket leads from the AMP connector.
12.4 TROUBLESHOOTING
When malfunctionion is suspected, the first step in
troubleshooting is to examine the circuit breaker and its
power system for abnormal conditions such as:
a) Breaker tripping in proper response to overcurrents or
incipient ground faults.
b) Breaker remaining in a trip-free state due to
mechanical maintenance along Its trip shaft.
c) Inadvertent shunt trip activations.
WARNING: DO NOT CHANGE TAPS ON THE CUR·
RENT SENSORS OR ADJUST THE PROGRAMMER
UNIT SET KNOBS WHILE THE BREAKER IS CAR·
RYING CURRENT.
PROGRAP.!t.!ER
HAR N E SS
64
FIG. 87 - M I C ROVERSATRIP C OM P O N ENT
Once It has been established that the circuit breakf
can be opened and closed normally from the test posltior.,
attention can be directed to the trip device proper. Testing
is performed by either of two methods:
1 . Conduct high-current, single-phase tests on the
breaker using a high current-low voltage test set.
NOTE: For these single-phase tests, special connec­
be
tions must employed for Micro Versa Trip breakers
equipped with Ground Fault. Any single-phase Input
to
the programmer circuit will generate an unwanted
"ground fault" output signal which will trip the
be
breaker. This can
a) Using the Ground Fault Defeat Cable as shown In
93.
Fig. This special test cable energizes the pro­
grammer circuit in a self-cancelling, series-parallel
connection so that Its output is always zero.
2. Test the components of the MicroVersaTrip system
using portable Test Set Type TVTS1 (Fig. 88). The
plicable test procedures are detailed in instruction Boo k
GEK-84464 .
The time-current characteristics for the M icroVersaTrip
Trip Device are given in curves GES8195 and GES8199.
nullified either by
ap­