Table of Contents
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P
reshoot, 3-52
Pulse Ab erration T est, 3-50
Trailing
E
dge, 3-46
Transition Time, 3-43
ΤΤ , 3-43
W
idth, 3-13
Wi dt h Jitter, 3-30
theory
o
f
o
perat ion, 7-1
Thermal Protection, 1-3
T
oo ls, 5-2
Transition Time
l
eadin g Ed ge, 3-45
Troubleshooting
D
es kew Board, 4-20
Microprocessor Board, 4-15
Outpu t
B
oard, 4-21
Period
B
oard, 4-17
PLL Board, 4-19
P
ower Supply Board , 4-7
V
entil at ion, 1-3
V
erification T ests, 3-1
1η/
W
eight, 2-1
Wi dt h Test, 3-15
Width Test
R
es ults, 3-16
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Table of Contents
