Malvern Instruments Zetasizer Nano Accessories Manual page 54

Chapter 3
Tracer measurement - Advanced
Refer to the Measurement - Material description in the zeta potential SOPs
section of the main user manual.
Data processing
This window allows the advanced analysis parameters to be set. It is generally best
to leave these set to default.
Size ranges and measurement thresholds can be applied to the analysis to filter
spurious peaks prior to the analysis being performed. These can be setup using the
Configure button.
Page 3-14
Settings Description
SZP The Tracer measurement displacement defines the
displacement distance from the sample at which this FFR only
(continued) measurement takes place. The displacement is altered in
125micron increments.
Surface zeta potential cell
MAN 0487