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A non destructive RAM test is performed that stores
known characters to each RAM location. The value is
read back and verified. The original value is finally
replaced. If an error is detected, the following display is
shown; see Fig. 3-44. The operator may enter a "0" to
continue the self test. Otherwise, the test resumes
automatically after about a minute.
SELF TEST
COMPLETE
*ERROR IN VOLATILE RAM*
PUSH 0 TO CONTINUE
FIGURE 3-44.
NON-DESTRUCTIVE RAM TEST ERROR
Next, a checksum check is performed to verify that the
PROM program has not changed. The error screen for
this type of error is shown in Fig. 3-45. If a checksum er-
ror is detected
in an
PROM device,
then an
alphanumeric specifier identifies the socket it is in. M 1
identifies the PROM device in the leftmost socket on the
microprocessor board, M2 the 2nd from the left, M3 the
3rd from the left, and so on. The operator can enter a
"0" to allow testing to proceed. If no entry is made in a
minute, the test will proceed automatically.
3-22
SELF TEST
COMPLETE
*CHECKSUM ERROR IN ROM*
ROM NUMBER
Ml M2 M3 M4 M5
PUSH 0 TO CONTINUE
FIGURE 3-45.
CHECKSUM ERROR SCREEN
NOTE
If a non-destructive RAM error and checksum error are
both detected, then they appear on the same screen.
The testing is completed with a final checkerboard pat-
tern with a "SELF TEST COMPLETED" message.
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