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This document is intended only to assist the reader in the use of the product. ARM shall not be liable for any loss or damage arising from the use of any information in this document, or any error or omission in such information, or any incorrect use of the product.
Identifies the minor revision or modification status of the product. Intended audience This book is written for hardware engineers who are familiar with ARM technology and want to use the MBIST controller to test the RAM blocks used by the cache controller. The AXI protocol is not specified but some familiarity with AXI is assumed.
Preface Feedback ARM welcomes feedback on this product and its documentation. Feedback on this product If you have any comments or suggestions about this product, contact your supplier and give: • The product name. • The product revision or version.
If you want to use the banked RAM organization both of these 'defines have to be uncommented. The banked RAM structure splits both the Data RAM and Data parity RAM into four arrays. Two dedicated L2C-310 MBIST Yaddr bits select one of the four arrays.See Y-address and...
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When the instruction shift is enabled, data shifts between the two parts of the BIST engine are on bit 3. In run test mode, this bit is used as invert data information. The MBISTTX[11:0] interface is ARM-specific and intended for use only with the MBIST controller.
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This signal is an output of the dispatch unit that goes to the MBIST controller. The behavior of MBISTRX[2:0] is ARM-specific and is intended for use only with the MBIST controller. The address expire signal is set when both the row and column address counters expire.
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Y-address and X-address fields, MBIR[36:33] and MBIR[40:37] on page 3-7 for more information on the doubleword select value. Contact ARM if you require more information. 2.2.2 Bitmap mode In bitmap mode, you can identify all failing locations in a RAM. Each time a failure occurs, the...
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Read Write Read March (y-fast) Bang This test suite provides a comprehensive test of the arrays. The series of tests in Go/No-Go are the result of the experience in memory testing by ARM memory test engineers. 3.2.2 Control field, MBIR[54:49] The control field specifies the MBIST function.
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Advanced Microcontroller Bus Architecture (AMBA) A family of protocol specifications that describe a strategy for the interconnect. AMBA is the ARM open standard for on-chip buses. It is an on-chip bus specification that describes a strategy for the interconnection and management of functional blocks that make up a System-on-Chip (SoC).
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See also Fast Context Switch Extension. Reads are defined as memory operations that have the semantics of a load. That is, the ARM Read...
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See Write-back. A 32-bit data item. Word Writes are defined as operations that have the semantics of a store. That is, the ARM instructions Write SRS, STM, STRD, STC, STRT, STRH, STRB, STRBT, STREX, SWP, and SWPB, and the Thumb instructions STM, STR, STRH, STRB, and PUSH. Java instructions that are accelerated by hardware can cause a number of writes to occur, according to the state of the Java stack and the implementation of the Java hardware acceleration.
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