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11. Typical Test Circuit
The components illustrated in the test circuit diagrams that follow are only used to confirm device characteristics.
Toshiba does not guarantee that these components will prevent malfunction or failure in your particular application
device.
50 Line
30.32MHz
SW3
0.1µF
28
29
100pF
30
100pF
31
32
100pF
33
34
35
36
Test Characteristics: V
, V
DD (5V)
Notice:
Measure after the parts tuning that shows a part number. TC32306FTG supply voltage is selected by SW1 and SW2. SW3 and SW4
allow selecting the crystal oscillator and external signal.
0.01µF
SW4
27
26
25
24
CS
CLK
MOSI
TC32306FTG
MISO
COM_VDD
DET_TMONI1
DATA_IO
IO_GND
1
2
3
4
f
f
f
f
DD (3V),
RF (315),
RF (434),
RF (868),
RF (915)
Fig 11-1 Typical Test Circuit
23
22
21
20
PA_OUT
PA_GND1
IF_REF
A_GND
A_REG
A_VDD_3V
RF_OUT
5
6
7
8
83
TC32306FTG
19
18
17
16
15
0.1µF
14
0.1µF
13
0.1µF
12
SW1
11
10
9
330pF
2015-10-01
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