Flaw Detection - Panasonic Micro-Imagechecker PV310 Brochure & Specs

Image processing device micro-imagechecker
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New Function

Flaw Detection

Scratches, stains, chipped edges, burrs
and other defects that could previously
only be detected by a more upscale
model can now be detected.
Surface scratches
Chipping and burrs
and stains
Chipping and burrs
Enhanced Functionality, Improved Performance
Improved
Smart Matching From
0 to 360
The matching function has been improved to inspect
workpieces rotated from 0 to 360 .
New Function
Auto Area
Adjustment
The inspection area can be
automatically adjusted to the workpiece
size to cover slight variations
(dimensional tolerance of workpieces).
Auto
adjustment
New Function
Filters Increase Reliability
13 filters are available to increase
the reliabilty and accuracy of
inspections. You may combine up
to 5 filters.
Filter useful for noise removal
Expansion → Contraction
(Black noise removal)
Filter useful for contour extraction
Sobel
(Edge detection)
New Function
Low Contrast
Matching
The workpiece can be detected even if
the contrast to the background is low or
if the workpiece itself is damaged.
Detects low-contrast
images.
Detects partly chipped
images.
Expansion
Edge enhancement
Laplacian
Workpiece
Edge detection:
Y direction
Edge detection:
X direction
Sobel
Prewitt
Contraction
Median
Smoothing
Expansion
Contraction
Contraction
Expansion
Background
cutting
3

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