Hitachi Relion 670 Series Commissioning Manual page 211

1MRK506371-UUS Rev. M
11.10.1.1 Testing the synchronizing function
The voltage inputs used are:
V3PL1
V3PBB1
Testing the frequency difference
The frequency difference test should verify that operation is achieved when the frequency difference
between bus and line is less than set value of FreqDiffMax and above set value of FreqDiffMin. The test
procedure below will depend on the settings used. Input STARTSYN must be activated during the test.
FreqDiffMax = 50.2 Hz
FreqDiffMin = 50.01 Hz
tBreaker = 0.080 s
1. Apply voltages
1.1. V-Line = 100% VBaseLine and f-Line = 60.0 Hz
1.2. V-Bus = 100% VBaseBus and f-Bus = 60.15Hz
2. Check that a closing pulse is submitted at a closing angle equal to calculated phase angle value
from the formula below. Modern test sets will evaluate this automatically.
Closing Angle = |( (f
f
Bus
f
Line
tBreaker = Set closing time of the breaker
3. Repeat with
3.1. V-Bus = 100% VBaseBus and f-bus = 60.25 Hz, to verify that the function does not trip when
4. Verify that the closing command is not issued when the frequency difference is less than the set
value FreqDiffMin.
11.10.1.2 Testing the synchrocheck functionality
During the test of SESRSYN (25) for a single bay arrangement, these voltage inputs are used:
V-Line
V-Bus
Testing the voltage difference
Set the voltage difference to 0.15 p.u. on the local HMI, and the test should check that operation is
achieved when the voltage difference VDiffSC is lower than 0.15 p.u.
The settings used in the test shall be final settings. The test shall be adapted to site setting values
instead of values in the example below.
Test with no voltage difference between the inputs.
Line distance protection REL670
Commissioning manual
VA, VB or VC line 1 voltage inputs on the IED
Bus1 voltage input on the IED
– f ) * tBreaker * 360 degrees) |
Bus Line
= Bus frequency
= Line frequency
frequency difference is above limit.
VA, VB or VC line 1 voltage input on the IED according to the connection in SMT
V5 voltage input on the IED according to the connection in SMT
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Section 11
Testing functionality by secondary injection
M2377-116 v11
M2377-21 v8
M2377-132 v9
M2377-194 v8
205