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SPECI FICATION
Same as EXTERNAL TRIGGER MODE (SLOW), para-
graph 4-9.
4-12
EXTERNAL TRIGGER MODE (FAST)
TEST
Oscilloscope:
Sensitivity
200mV/div
Trigger
external
Timebase mode
expanded
Timebase - direct
20ns/div
Timebase - expanded
0.5ns/div
OESCRI PTION
2.
Adjust the Model8081A EXT INPUT LEVEL
control to obtain a stable 50% duty cycle display.
A high frequency test of the Model 8081 A external
trigger mode using an external pu Ise generator to apply a
trigger signal of 250M Hz.
3.
Each trigger pulse from the pulse generator should
release one output pu Ise from the Model 8081 A.
Check that the display has a frequency of
250M Hz.
EXTERNAL GATE MODE (FAST)
TEST
Same as EXTERNAL GATE MODE (SLOW), paragraph
4-10.
4-13
SPECIFICATION
SAMPLING
OSCILLOSCOPE
DESCRIPTION
Figure 4-6. External Trigger Mode (Fast) Test Setup
EQUIPMENT
The maximum external gate frequency of the Model
8081 A is tested in external gate mode using an external
pulse generator to apply a gate signal of 150MHz.
SAr,.lPLIfIlG
OSCII,.LOSCOPE
1.
Set up the equ ipment as shown in figure 4-6 and
set the controls as follows:
PROCEDURE
Pulse Generator
HP 8082A
Sampling Oscilloscope
HP 182C with 181 OA
plug-in
Pulse Generator:
Figure 4-7. External Gate Mode (Fast) Test Setup
Repetition rate
250MHz
Pulse width
2ns
Amplitude
0.2 V
Polarity
positive
EQUIPMENT
Pulse Generator
HP 8082A
Sampling Oscilloscope
HP
182C with 1810A
plug-in
8081A:
RATE range
-
Rate VERNI ER
_
-
Operating Mode switch
TRIG
EXT INPUT LEVEL
center
NEG-POS-MAN switch
POS
PROCEDURE
1.
Set up the equ ipment as shown in figure 4-7 and
set up the controls as follows:
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